UV-INDUCED CHANGES OF THE POLARIZATION PROFILE OF Pb(Zr,Ti)O₃ THIN FILMS

REFERENCES

• Dimos , D. , Warren , W. L. and Tuttle , B. A. 1993 . Photo-induced and electrooptic properties of (Pb,La)(Zr,Ti)O3 films . Mat. Res. Symp. Proc. , 310 : 87 – 98 . [CSA]
   Google Scholar
• Warren , W. L. , Dimos , D. , Tuttle , B. A. , Nasby , R. D. and Pike , G. E. 1994 . Electronic domain pinning in Pb(Zr, Ti)O3 thin films and its role in fatigue . Appl. Phys. Lett. , 65 : 1018 – 1020 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Lee , J. , Esayan , S. , Safari , A. and Ramesh , R. 1996 . Fatigue and photoresponse of lead zirconate titanate thin film capacitors . Integrated Ferroelectrics , 6 : 289 – 300 . [CSA]
   Google Scholar
• Dudkevich , V. P. , Sem , I. M. , Sviridov , E. V. and Surowiak , Z. 1995 . Light influence on fatigue in PZT films with planar electrodes . Mat. Res. Symp. Proc. , 361 : 185 – 190 . [CSA]
   Google Scholar
• Dimos , D. , Warren , W. L. , Sinclair , M. B. , Tuttle , B. A. and Schwartz , R. W. 1994 . Photoinduced hysteresis changes and optical storage in (Pb,La)(Zr,Ti)O3 films and ceramics . J Appl Phys , 76 : 4305 – 4315 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Kholkin , A. L. and Setter , N. 1997 . Photoinduced poling of lead titanate zirconate thin films . Appl Phys Lett , 71 : 2854 – 2856 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Kholkin , A. L. , Iakovlev , S. O. and Baptista , J. L. 2001 . Polarization control and domain manipulation in ferroelectric films with UV light . Integrated Ferroelectrics , 37 : 195 – 204 . [CSA]
   Web of Science ®Google Scholar
• Fridkin , V. M. 1979 . “ Photoferroelectrics ” . In Solid State Sciences 9 , Berlin, Heidelberg, New York : Springer-Verlag .
   Google Scholar
• Deyneka , A. , Suchaneck , G. , Jastrabik , L. and Gerlach , G. 2004 . Phase transition shift in lead-excess PZT films under UV illumination . Integrated Ferroelectrics , 67 : 173 – 181 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Land , C. E. and Peercy , P. S. 1982 . A review of the effect of ion implantation on the photoelectric properties of PLZT ceramics . Ferroelectrics , 45 : 25 – 43 . [CSA]
   Web of Science ®Google Scholar
• Suchaneck , G. and Gerlach , G. 2001 . Ferroelectric-semiconductor UV sensors . Phys. Stat. Sol. , 185 : 115 – 120 . [CROSSREF] [CSA]
   Google Scholar
• Afanasiev , P. V. , Afanasjev , V. P. , Bulat , D. Y. , Pankrashkin , A. V. , Pronin , I. P. , Suchaneck , G. and Gerlach , G. 2005 . Storage and erasure of optical information in Pt-PZT-SnO2 thin film structures . Ferroelectrics , in print[CSA]
   Google Scholar
• Sandner , T. , Suchaneck , G. , Koehler , R. , Suchaneck , A. and Gerlach , G. 2002 . High frequency LIMM - a powerful tool for ferroelectric thin film characterization . Integrated Ferroelectrics , 46 : 243 – 257 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Suchaneck , G. , Solnyshkin , A. V. , Kiselev , D. A. , Bogomolov , A. A. and Gerlach , G. 2005 . The LIMM problem for ferroelectric thin films comprising space charge layers . J European Ceram Soc. , (in print)[CSA]
   Google Scholar
• Lu , X. , Schlaphof , F. , Grafström , S. , Loppacher , Ch. , Eng , L. M. , Suchaneck , G. and Gerlach , G. 2002 . Scanning force microscopy investigation of the Pb (Zr0.25Ti0.75)O3/Pt interface . Appl. Phys. Lett. , 81 : 3215 – 3217 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Deineka , A. , Jastrabik , L. , Suchaneck , G. and Gerlach , G. 2001 . Ellipsometric investigations of the refractive index depth profile in PZT thin films . Phys. Stat. Sol. , 188 : 1549 – 1552 . (a)[CROSSREF] [CSA]
   Google Scholar
• Pike , G. E. , Warren , W. L. , Dimos , D. , Tuttle , B. A. , Ramesh , R. , Lee , J. , Keramidas , V. G. and Evans , J. T. 1995 . Voltage offsets in (Pb;La)(Zr,Ti)O3 thin films . Appl. Phys. Lett. , 66 : 484 – 486 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Ploss , B. , Emmerich , R. and Bauer , S. 1992 . Thermal wave probing of pyroelectric distributions in the surface region of ferroelectric materials: A new method for the analysis . J. Appl. Phys. , 72 : 5363 – 5370 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar
• Bauer , S and Bauer-Gogonea , S. 2003 . Current practice in space charge and polarization profile measurements using thermal techniques . IEEE Trans Dielectrics and Electrical Insulation , 10 : 883 – 902 . [CROSSREF] [CSA]
   Web of Science ®Google Scholar