Dielectric Functions of Niobium Doped Bi_3.25La_0.75Ti₃O₁₂ Thin Films Using Spectroscopic Ellipsometry

References

• Bahng , J. H. , Lee , M. , Park , H. L. , Kim , W. III , Jeong , J. H. and Kim , K. J. 2001 . Spectroscopic ellipsometry study of SrBi2Ta2O9 ferroelectric thin films . Appl. Phys. Lett. , 79 : 1664
   Web of Science ®Google Scholar
• Kingon , A. and Srinivasan , S. 2005 . Lead zirconate titanate thin films directly on copper electrodes for ferroelectric, dielectric and piezoelectric applications . Nature , 4
   Web of Science ®Google Scholar
• Kato , K. , Suzuki , K. , Kasner , W. H. and Francombe , M. H. 2001 . Ferroelectric properties of alkoxy-derived CaBi4Ti4O15 thin films on Pt-passivated Si . Appl. Phys. Lett. , 78 : 1119
   Web of Science ®Google Scholar
• Hou , Y. , Xu , X. H. , Wang , H. , Wang , M. and Wang , S. X. 2001 . Bi3.25La0.75Ti3O12 thin films prepared on Si (100) by metalorganic decomposition method . Appl. Phys. Lett. , 78 : 1733
   Web of Science ®Google Scholar
• Subbarao , E. C. 1961 . Ferroelectricity in Bi4Ti3O12 and its solid solutions . Phys. Rev. , 122 : 804 – 807 .
   Web of Science ®Google Scholar
• Park , B. H. , Kang , B. S. , Bu , S. D. , Noh , T. W. , Lee , L. and Joe , W. 1999 . Lanthanum-substituted bismuth titanate for use in non-volatile memories . Nature , 401 : 682
   Web of Science ®Google Scholar
• Scott , J. F. , Paz de Araujo , C. A. and Melnick , B. M. 1994 . Loss mechanisms in fin’e-grained ferroelectric ceramic thin films for ULSI memories (DRAMs) . J. Alloys Compd. , 211 : 451
   Web of Science ®Google Scholar
• Hu , Zhigao , Wang , Genshui , Huang , Zhiming and Junhao , Chu . 2003 . Optical properties of Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry . J. Appl. Phys. , 93 : 7
   Web of Science ®Google Scholar
• Hou , Yun , Xue , Jianqiang , Huang , Zhiming , Li , Tianxin , Ge , Yujian and Chu , Junhao . 2008 . Structure-related optical properties of Bi4−xLaxTi3O12 thin films grown on Pt/Ti/SiO2/Si substrate . Thin Solid Films , 517 : 901
   Web of Science ®Google Scholar
• Hu , Z. G. , Ma , J. H. , Huang , Z. M. , Wu , Y. N. , Wang , G. S. and Chu , J. H. 2003 . Dielectric functions of ferroelectric Bi3.25La0.75Ti3O12 thin films on Si(100) substrates . Appl. Phys. Lett. , 83 : 3686
   Web of Science ®Google Scholar
• Gu , H. S. , Bao , D. H. , Wang , S. M. , Gao , D. F. , Kuang , A. X. and Li , X. J. 1996 . Synthesis and optical properties of highly c-axis oriented Bi4Ti3O12 thin films by sol-gel processing . Thin Solid Films , 283 : 81
   Web of Science ®Google Scholar
• Yamaguchi , M. , Nagamoto , T. and Omoto , O. 1997 . Preparation of highly c-axis-oriented Bi4Ti3O12 thin films and their crystallographic, dielectric and optical properties . Thin Solid Films , 300 : 299
   Web of Science ®Google Scholar
• Singh , S. K. and Ishiwara , H. 2007 . Site engineering in chemical-solution-deposited Bi3.25La0.75Ti3O12 thin films using Ce, Zr, Mn and Si atoms . J. Sol-Gel Sci. Technol. Feb. ,
   Google Scholar
• Fujiwara , H. 2007 . Spectroscopic Ellipsometry: Principles and Applications , John Wiley & Sons Ltd. .
   Google Scholar
• Tompkins , H. G. and Irene , E. A. , eds. 2005 . Handbook of Ellipsometry , Norwich, NY : William Andrew Publishing .
   Google Scholar
• Jellison , G. E. Jr and Modine , F. A. 1996 . Parameterization of the optical functions of amorphous materials in the interband region . Appl. Phys. Lett. , 69 : 371 – 373 . Erratum, Appl. Phys. Lett. 69, 2137 (1996)
   Web of Science ®Google Scholar
• Hilfiker , James N. , Singh , Neha , Tiwald , Tom , Convey , Diana , Smith , Steven M. Baker , Jeffrey H. 2008 . Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry . Thin Solid Films , 516 : 7979
   Web of Science ®Google Scholar
• Tian , H. Y. , Luo , W. G. , Pu , X. H. , He , X. Y. , Qiu , P. S. , Ding , A. L. , Yang , S. H. and Mo , D. 2001 . J. Phys. Condens. Matter. , 13 : 4065
   Web of Science ®Google Scholar
• Tauc , J. C. 1972 . Optical Properties of Solids , Amsterdam : North-Holland .
   Google Scholar
• Wood , D. L. and Tauc , J. C. 1972 . Weak absorption tails in amorphous semiconductors . Phys. Rev. B , 5 : 3144
   Web of Science ®Google Scholar
• Trolier-McKinstry , S. , Hu , H. , Krupanidhi , S. B. , Chindaudom , P. , Vedam , K. and Newnham , R. E. 1993 . Spectroscopic ellipsometry studies on ion beam sputter deposited Pb(Zr, Ti)O3 films on sapphire and Pt-coated silicon substrates . Thin Solid Films , 230 : 15
   Web of Science ®Google Scholar
• El-Fadl , A. Abu and Anooz , S. Bin . 2006 . Optical properties of pure and metal ions doped ammonium sulfate single crystals . Cryst. Res. Technol. , 41 ( 5 ) : 487
   Web of Science ®Google Scholar