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Original Articles

Extended Characterization of the Common-Source and Common-Gate Amplifiers Using a Metal-Ferroelectric-Semiconductor Field Effect Transistor

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Pages 71-80 | Received 29 Sep 2013, Accepted 11 Mar 2014, Published online: 16 Jun 2014

References

  • M. Hunt, R. Sayyah, T.C. MacLeod, and F.D. Ho, Characterization of a Common-Source Amplifier Using Ferroelectric Transistors. Integrated Ferroelectrics. 124, 157–166 (2011).
  • M. Hunt, R. Sayyah, T.C. MacLeod, and F.D. Ho, Characterization of a Common-Gate Amplifier Using Ferroelectric Transistors. Integrated Ferroelectrics. 134, 121–129 (2012).
  • J. Evans, Modeling Radiant Thin Ferroelectric Film Transistors. Technical Report. Radiant Technologies, Inc. (2011).
  • R. Sayyah, M. Hunt, F.D. Ho, A physically-derived nonquasi-static model of ferroelectric amplifiers for computer-aided device simulation – Part I: The ferroelectric common-drain amplifier. Solid-State Electronics. 86, 51–57 (2013).
  • M. Hunt, An Empirical Study and Modeling on Selected Analog Circuits Using a Metal-Ferroelectric-Semiconductor Field Effect Transistor. Thesis, University of Alabama in Huntsville. 2011.

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