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Integrated Ferroelectrics
An International Journal
Volume 4, 1994 - Issue 1
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An I-V measurement method and its application for characterizing ferroelectric PZT thin films

S. C. Lee Department of Electrical and Computer Engineering, University of Arizona, Tucson, AZ, 85721, USA
,
G. Teowee Department of Materials Science and Engineering, University of Arizona, Tucson, AZ, 85721, USA
,
R. D. Schrimpf Department of Electrical and Computer Engineering, University of Arizona, Tucson, AZ, 85721, USA
,
D. P. Birnie III Department of Materials Science and Engineering, University of Arizona, Tucson, AZ, 85721, USA
,
D. R. Uhlmann Department of Materials Science and Engineering, University of Arizona, Tucson, AZ, 85721, USA
&
K. F. Galloway Department of Electrical and Computer Engineering, University of Arizona, Tucson, AZ, 85721, USA
Pages 31-43 | Received 13 May 1993, Published online: 11 Oct 2011

References

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  • Carrano , J. , Sudhama , C. , Chikarmane , V. , Lee , J. , Tasch , A. , Shepherd , W. and Abt , N. 1991 . Electrical and Reliability Properties of PZT thin Films for ULSI DRAM Applications . IEEE Trans. Ultrasonics, Ferroelectrics, and Freq. Control , 38 : 690
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  • Sawyer , C. B. and Tower , C. H. 1930 . Rochelle Salt as a Dielectric . Phys. Rev. , 35 : 269
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  • 1990 . “ RT66A Standardized Ferroelectric Tester V 2.0 Operating Manual ” . Radiant Technologies .
  • Shepherd , W. H. Material Research Soc. Symposium Pro. Fatigue and Aging in Sol-Gel Derived PZT Thin Films Ferroelectric thin films . Edited by: Myers , E. R. and Kingon , A. I. Vol. 200 , pp. 277
  • Duiker , H. M. , Beale , P. D. , Scott , J. F. , Paz de Araujo , C. A. , Melnick , B. M. , Cuchiaro , J. D. and McMillian , L. D. 1990 . Fatigue and switching in ferroelectric memories: Theory and experiment . J. Appl. Phys. , 68 : 5783

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