High frequency fatiguing of ferroelectric capacitors

Norman E. Abt Fairchild Research Center, M/S E140, National Semiconductor Corporation, Santa Clara, CA, 95052-8090, USA

Petar Misic Fairchild Research Center, M/S E140, National Semiconductor Corporation, Santa Clara, CA, 95052-8090, USA

David Zehngut Fairchild Research Center, M/S E140, National Semiconductor Corporation, Santa Clara, CA, 95052-8090, USA

Edward Regan Fairchild Research Center, M/S E140, National Semiconductor Corporation, Santa Clara, CA, 95052-8090, USA

References

Evans , J. T. and Womack , R. 1988 . IEEE Journal of Solid State Circuits , 23 : 1171
Web of Science ®Google Scholar
Kulkarni and Abt . Proceedings of the 4th International Symposium on Integrated Ferroelectrics . Vol. 363 ,
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