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Integrated Ferroelectrics
An International Journal
Volume 10, 1995 - Issue 1-4
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Characterization and testing

An optical study of PZT thin film capacitors

C. R. Peterson School of Materials Engineering Purdue University, W. Lafayette, Indiana, 47907
,
S. A. Mansour School of Materials Engineering Purdue University, W. Lafayette, Indiana, 47907
&
A. Bement Jr. School of Materials Engineering Purdue University, W. Lafayette, Indiana, 47907
Pages 295-300 | Received 22 Mar 1995, Published online: 19 Aug 2006

References

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  • Prisedsky , V. V. , Shishkovsky , V. I. and Klimov , V. V. 1978 . Ferroelectrics , 17 : 465
  • Pike , G. E. , Warren , W. L. , Dimos , D. , Tuttle , B. A. , Ramesh , R. , Lee , J. , Keramidas , V. G. and Evans , J. T. 1995 . Appl. Phys. Lett. , 66 : 4
  • Wu , Z. and Sayer , M. 1992 . IEEE , : 244 – 247 . CH3080–0–7803–0465–9/92
  • Feil , W. A. and Wessels , B. W. 1993 . J. Appl. Phys. , 74
  • Thakoor , S. and Maserjian , J. 1994 . J. Vac. Sci. Technol. A. , 12 : 295
  • Peng , C. H. , Chang , J. F. and Desu , S. B. 1991 . Mat. Res. Soc. Proc. , 243 : 21
  • Thakoor , S. 1993 . Appl. Phys. Lett. , 63 : 3233
  • Fridkin , V. M. 1975 . Ferroelectric Semiconductors , New York : Plenum Pub. .

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