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Integrated Ferroelectrics
An International Journal
Volume 11, 1995 - Issue 1-4
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Original Articles

Effects of interfacial roughness on the leakage properties of SrTiO3 thin film capacitors

Yukio Fukuda Texas Instruments Japan Ltd., Inashikigun, Ibaraki, 300–04, Japan
,
Katsuhiro Aoki Texas Instruments Japan Ltd., Inashikigun, Ibaraki, 300–04, Japan
,
Ken Numata Texas Instruments Japan Ltd., Inashikigun, Ibaraki, 300–04, Japan
,
Shintaro Aoyama Texas Instruments Japan Ltd., Inashikigun, Ibaraki, 300–04, Japan
,
Akitoshi Nishimura Texas Instruments Japan Ltd., Inashikigun, Ibaraki, 300–04, Japan
,
Scott Summerfelt Texas Instruments Incorporated, Dallas, TX, 75246, USA
&
Robert Tsu Texas Instruments Incorporated, Dallas, TX, 75246, USA
 show all
Pages 121-127 | Received 22 Mar 1995, Published online: 19 Aug 2006

References

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