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Original Articles

Domain behavior in lead zirconate titanate (PZT) thin film capacitors

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Pages 329-336 | Received 02 May 1994, Published online: 19 Aug 2006

References

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  • Vijay , D. , Kwok , C. , Pan , W. , Yoo , I. K. and Desu , S. B. 1992 . Electrode Effects on Electrical Properties of Ferroelectric Thin Films . : 408 – 411 . 8th ISAF
  • Yoo , I. K. and Desu , S. B. 1992 . Leakage Current Mechanism and Accelerated Unified Test of Lead Zirconate Titanate Thin Film Capacitors . : 225 – 228 . 8th ISAF
  • Lee , J. C. private communication
  • Desu , S. B. 1994 . “ Interactions at Ferroelectric-Electrode Interfaces ” . In 6th ISIF Proceedings To be published
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  • Nasby , R. , Schwank , J. , Rodgers , M. and Miller , S. 1992 . Aspects of Fatigue and Rapid Depolarization in Thin Film PZT Capacitors . Integrated Ferroelectrics , 2 : 91 – 104 .
  • Mihara , T. , Watanabe , H. and Araujo , A. 1993 . Evaluation of Imprint Properties in Sol-Gel Ferroelectric Pb(ZrTi)O3 Thin-Film Capacitors . Jpn. J. Appl. Phys. , 32 : 4168 – 4174 .
  • Kim , J. , Sudhama , C. , Khamankar , R. and Lee , J. 1993 . Ultra-Thin Sputtered PZT Films for ULSI DRAMs . MRS Proceedings , 310 : 473 – 478 .
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  • Yoo , I. K. and Desu , S. B. 1993 . Correlations among Degradations in Lead Zirconate Titanate Thin Film Capacitors . MRS Proceedings , 310 : 165 – 177 .

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