11
Views
17
CrossRef citations to date
0
Altmetric
Original Articles

Characterization of (Ba0.5,Sr0.5)TIO3 thin films by the laser ablation technique and their electrical properties with different electrodes

, &
Pages 329-339 | Received 15 May 1994, Published online: 19 Aug 2006

References

  • Scott , J. F. , Kammerdiner , L. , Parris , M. , Traynor , S. , Ottenbacher , V. , Shawabkeh , A. and Oliver , W. F. 1988 . J. Appl. Phys. , 64 : 787
  • Sinharoy , S. , Buhay , H. , Francombe , M. H. , Takei , W. J. , Doyle , N. J. , Rieger , J. H. , Lampe , D. R. and Stepke , E. 1991 . J. Vac. Sci. & Technol. , A9 : 409
  • Yamamichl , S. , Sakuma , T. , Takemura , K. and Miyasaka , Y. 1991 . Jpn. J. Appl. Phys. , 30 : 2193
  • Parker , L. H. and Tasch , A. H. January 1990 . IEEE Circ. Dev. Mag. January , 17
  • Araujo , L. A. , McMillan , L. D. , Melnick , B. M. , Cuchiaro , J. D. and Scott , J. F. 1990 . Ferroelectrics , 104 : 241
  • Moazzami , R. , Hu , C. and Shepherd , W. H. 1990 . IEEE. Electron. Device. Lett. , 11 : 454
  • Blanton , T. S. , Barnes , C. R. and Lelental , M. 1991 . Physica , C173 : 152
  • Lee , J. and Safari , A. 1993 . Ph.D Thesis Rutgers Univ. .
  • Mansingh , A. and Krupanidhi , S. B. 1981 . Thin Solid Films , 80 : 359

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.