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Integrated Ferroelectrics
An International Journal
Volume 17, 1997 - Issue 1-4
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Drams and materials

Effect of rapid thermal annealing on the interface trap density between Pt and (Ba,Sr)TiO3 thin film

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Pages 179-186 | Published online: 19 Aug 2006

References

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  • Ichinose , N. and Ogiwara , T. 1995 . Jpn. J. Appl. Phys. , 34 : 5201
  • Takemura , K. , Yamamichi , S. , Lesaicherre , P. Y. , Tokashiki , K. , Miyamoto , H. , Ono , H. , Miyasaka , Y. and Yoshida , M. 1995 . Jpn. J. Appl. Phys. , 34 : 5224
  • Cha , S. Y. , Lee , H. C. , Lee , W. J. and Kim , H. K. 1995 . Jpn. J. Appl. Phys. , 34 : 5221
  • Kwak , D. H. , Jang , B. T. , Cha , S. Y. , Lee , S. H. and Lee , H. C. 1996 . Proc. of the Third Pacific-Rim Conference on Ferroelectric Applications , : 187 and will be published in Integrated Ferroelectrics
  • Fukuda , Y. , Aoki , K. , Numata , K. and Nishimura , A. 1995 . Jpn. J. Appl. Phys. , 34 : L1292

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