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Integrated Ferroelectrics
An International Journal
Volume 16, 1997 - Issue 1-4
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Device intergration issues and testing

Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation

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Pages 63-76 | Received 18 Mar 1996, Published online: 19 Aug 2006

References

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  • Paz deAraujo , C. A. , Cuchiaro , J. D. , McMillan , L. D. , Scott , M. C. and Scott , J. F. 1995 . Nature , 374 : 627
  • Evans , Joe T. Jr. and Cardoza , Hayley E. 1995 . Integrated Ferroelectrics , 10 : 267
  • Benedetto , J. M. , Roush , M. L. , Lloyd , I. K. , Ramesh , R. and Rychlik , B. 1995 . Integrated Ferroelectrics , 10 : 279
  • Nakamura , T. , Nakao , Y. , Kamisawa , A. and Takasu , H. 1995 . Integrated Ferroelectrics , 11 : 161
  • Fatuzzo , Ennio and Merz , Walter J. 1967 . Ferroelectricity , 105 Amsterdam : North Holland Publishing Company .

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