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Integrated Ferroelectrics
An International Journal
Volume 16, 1997 - Issue 1-4
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Device intergration issues and testing

The effects of ferroelectric capacitor testing methods on predicted imprint failure points

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Pages 87-96 | Received 18 Mar 1996, Published online: 19 Aug 2006

References

  • Abt , N. E. 1991 . “ Anomalous Remanent Polarization in Ferroelectric Capacitors ” . In Proceedings of the 3rd International Symposium on Integrated Ferroelectrics 404 – 413 .
  • Evans , J. T. Jr. and Cardoza , H. E. 1995 . Integrated Ferroelectrics , 10 : 267 – 278 .
  • Ramesh , R. , Warren , W. L. , Pike , G. E. , Dimos , D. , Tuttle , B. A. and Evans , J. T. Jr. 1995 . Hysteresis Relaxation in (Pb, La)(Zr, Ti)O3 Thin Film Capacitors with La-Sr-Co-O Electrodes . unpublished paper

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