Chemical solution deposition (CSD) and characterization of ferroelectric and dielectric thin films

N. Solayappan Symetrix Corporation, 5055 Mark Dabling Blvd., Colorado Springs, Colorado, 80918, USA

V. Joshi Symetrix Corporation, 5055 Mark Dabling Blvd., Colorado Springs, Colorado, 80918, USA

A. DeVilbiss Symetrix Corporation, 5055 Mark Dabling Blvd., Colorado Springs, Colorado, 80918, USA

J. Bacon Symetrix Corporation, 5055 Mark Dabling Blvd., Colorado Springs, Colorado, 80918, USA

J. Cuchiaro Symetrix Corporation, 5055 Mark Dabling Blvd., Colorado Springs, Colorado, 80918, USA

L. McMillan Symetrix Corporation, 5055 Mark Dabling Blvd., Colorado Springs, Colorado, 80918, USA

C. Paz de Araujo Symetrix Corporation, 5055 Mark Dabling Blvd., Colorado Springs, Colorado, 80918, USA

show all

References

Araujo , C. A. , Cuchiaro , J. D. , McMillan , L. D. , Scott , M. C. and Scott , J. F. 1995 . Nature , 374 : 627
Web of Science ®Google Scholar
Jones , R. E. 1997 . Solid State Technology , 40 : 201
Web of Science ®Google Scholar
Solayappan , N. , McMillan , L. D. , Araujo , C. A. and Grant , R. 1997 . Integrated Ferroelectrics , 18 : 127
Web of Science ®Google Scholar
Joshi , V. , Solayappan , N. , Hartner , W. , Schindler , G. , Dehm , C. , Mazure , C. and Derbenwick , G. Monterey , CA : Presented in ISIF '98 .
Google Scholar

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Chemical solution deposition (CSD) and characterization of ferroelectric and dielectric thin films

References

Information for

Open access

Opportunities

Help and information

Your download is now in progress and you may close this window

Login or register to access this feature

Chemical solution deposition (CSD) and characterization of ferroelectric and dielectric thin films

References

Reprints and Corporate Permissions

Academic Permissions

Related research

To cite this article:

Download citation

Information for

Open access

Opportunities

Help and information

Keep up to date