A simple method for high-frequency characterization of (Ba,Sr)TiO₃ thin film capacitors

Byung-Tak Jang Department of Electrical Engineering, KAIST, 373-1 Kusong-Dong, Yusong-Gu, Taejon, 305-701, Korea

Dong-Hwa Kwak Department of Electrical Engineering, KAIST, 373-1 Kusong-Dong, Yusong-Gu, Taejon, 305-701, Korea

Seon-Yong Cha Department of Electrical Engineering, KAIST, 373-1 Kusong-Dong, Yusong-Gu, Taejon, 305-701, Korea

Seung-Hoon Lee Department of Electrical Engineering, KAIST, 373-1 Kusong-Dong, Yusong-Gu, Taejon, 305-701, Korea; Memory Design Team, Samsung Electronics Co., Ltd San #24 Nongseo-Ri, Kiheung-Eup, Yongin-Goon, Kyungki-Do, 229-900, Korea

Hee Chul Lee Department of Electrical Engineering, KAIST, 373-1 Kusong-Dong, Yusong-Gu, Taejon, 305-701, Korea

References

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A simple method for high-frequency characterization of (Ba,Sr)TiO₃ thin film capacitors

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A simple method for high-frequency characterization of (Ba,Sr)TiO3 thin film capacitors

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A simple method for high-frequency characterization of (Ba,Sr)TiO₃ thin film capacitors