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Integrated Ferroelectrics
An International Journal
Volume 26, 1999 - Issue 1-4
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Section J: Testing and characterization

An optimized package test methodology for testing FRAM® memories

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Pages 297-310 | Received 07 Mar 1999, Published online: 19 Aug 2006

References

  • 1996 . Ramtron Specialty Memory Products Data Book , October
  • Test Methods and Procedures for Solid State Devices Used in Transportation/Automotive Applications, JEDEC Standard .
  • General Specification for Plastic Encapsulated Microcircuits for Use in Rugged Applications, JEDEC Standard .
  • 1991 . MIL-STD-883D . Test Methods and Procedures for Microelectronics , 15 November
  • Ramtron controlled document 60–1001: Retention testing procedure ,
  • Ramtron controlled document 60–1002: Endurance testing procedure ,
  • Ramtron controlled document 60–5018: 16K Qualification report ,

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