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Integrated Ferroelectrics
An International Journal
Volume 27, 1999 - Issue 1-4
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Section L: Novel characterization

Studies of hydrogen-induced degradation processes in Pb(Zr1-xTix)O3 (PZT) and SrBi2Ta2O9 (SBT) ferroelectric film-based capacitors

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Pages 147-157 | Received 07 Mar 1999, Published online: 19 Aug 2006

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