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Nondestructive Testing and Evaluation Volume 36, 2021 - Issue 4
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Research Article

Analytical model for rectangular side-by-side probe in eddy-current non-destructive inspection

Wu DehuiDepartment of Electronic Mechanical Engineering, School of Aerospace Engineering, Xiamen University, Xiamen, Fujian, ChinaCorrespondence[email protected]
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,
Wenxiong ChenDepartment of Electronic Mechanical Engineering, School of Aerospace Engineering, Xiamen University, Xiamen, Fujian, ChinaView further author information
,
Jiaxin YangDepartment of Electronic Mechanical Engineering, School of Aerospace Engineering, Xiamen University, Xiamen, Fujian, ChinaView further author information
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Fan YangDepartment of Electronic Mechanical Engineering, School of Aerospace Engineering, Xiamen University, Xiamen, Fujian, ChinaORCID Iconhttps://orcid.org/0000-0003-1213-8982View further author information
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Pages 357-365 | Received 10 Oct 2019, Accepted 09 Aug 2020, Published online: 17 Sep 2020

References

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