84
Views
2
CrossRef citations to date
0
Altmetric
Original Articles

Determination of oxygen in acid-treated high-purity niobium by X-ray photoelectron spectroscopy

, , , , , & show all

References

  • Imakita, T.; Fudagawa, N.; Kubota, M. Determination of Trace Impurities in High−purity Niobium by Inductively Coupled Plasma Atomic Emission Spectrometry after Anion-exchange Separation. Analyst 1990, 115(9), 1185–1189.
  • Daccà, A.; Gemme, G.; Mattera, L.; Parodi, R. XPS Analysis of the Surface Composition of Niobium for Superconducting RF Cavities. Appl. Surf. Sci. 1998, 126(3–4), 219–230.
  • Wang, Q.-G.; Shang, J.-X.; Yang, Z.X. Firs–principles Study on the Initial Oxidization of a Nb(100) Surface. J. Phys. Chem. C 2012, 116(44), 23371–23376.
  • Li, S.Q.; Hu B.; Jiang, Z.C. Direct Determination of Trace Impurities in Niobium Pentaoxide Solid Powder with Slurry Sampling Fluorination Assisted Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry. J. Anal. At. Spectrom. 2004, 19(3), 387–391.
  • Winge, R.K.; Fassel, V.A. Simultaneous Determination of Oxygen and Nitrogen in Refractory Metals by the Direct Current Carbon−arc, Gas Chromatographic Technique. Anal. Chem. 1965, 37(1), 67–70.
  • Over, H.; Seitsonen, A.P. Oxidation of Metal Surfaces. Science 2002, 297(20), 2003–2005.
  • Miller, D.J.; Öberg, H.; Kaya, S.; Sanchez Casalongu, H.; Friebel, D.; Anniyev, T.; Ogasawara, H.; Bluhm, H.; Pettersson, L.G.M.; Nilsson, A. Oxidation of Pt(111) Under near–ambient Conditions. Phys. Rev. Lett. 2011, 107(19), 1955021–1–1955021–5.
  • Jugnet, Y.; Loffreda, D.; Dupont, C.; Delbecq, F.; Ehret, E.; Cadete Santos Aires, F.J.; Mun, B.S.; Akgul, F.A.; Liu, Z. Promoter Effect of Early Stage Grown Surface Oxides: A Near−ambient−pressure XPS Study of CO Oxidation on PtSn Bimetallics. J. Phys. Chem. Lett. 2012, 3(24), 3707–3714.
  • Knudsen, J.; Merte, L.R.; Peng, G.; Vang, R.T.; Resta, A.; Lægsgaard, E.; Andersen, J.N.; Mavrikakis, M.; Besenbacher, F. Low-Temperature CO Oxidation on Ni(111) and on A Au/Ni(111) Surface Alloy. ACS Nano 2010, 4(8), 4380–4387.
  • Donik, Č.; Kocijan, A.; Grant, J.T.; Jenko, M.; Drenik, A.; Pihlar, B. XPS study of Duplex Stainless Steel Oxidized by Oxygen Atoms. Corros. Sci. 2009, 51(4), 827–832.
  • Tucker, C.W.; Jr.; Seybolt, A.U.; Sumsion, H.T. The Location of Oxygen Atoms in Vanadium-Oxygen Alloys by Means of Neutron Diffraction. Acta Met. 1953, 1, 390–393.
  • American Society for Testing and Materials. Standard Test Method for Determination of Oxygen and Nitrogen in Titanium and Titanium Alloys by the Inert Gas Fusion Technique, ASTM E1409–08, United States, 2008.
  • Kamal, S.S.K.; Sahoo, P.K.; Vimala, J.; Durai, L. Determination of Oxygen and Nitrogen in Ag Nanoparticles: Role of Surfactants. Adv. Sci. Lett. 2010, 3(3), 299–302.
  • Hsieh, P.-T.; Chen, Y.-C.; Kao, K.-S.; Wang, C.-M. Luminescence Mechanism of ZnO Thin Film Investigated by XPS Measurement. Appl. Phys. A 2008, 90(2), 317–311.
  • Cherkashinin, G.; Nikolowski, K.; Ehrenberg, H.; Jacke, S.; Dimesso, L.; Jaegermann, W. The Stability of the SEI Layer, Surface Composition and the Oxidation State of Transition Metals at the Electrolyte–cathode Interface Impacted by the Electrochemical Cycling: X−ray Photoelectron Spectroscopy Investigation. Phys. Chem. Chem. Phys. 2012, 14(35), 12321–12331.
  • Burke, P.J.; Bayindir, Z.; Kipouros, G.J. X–ray Photoelectron Spectroscopy (XPS) Investigation of the Surface Film on Magnesium Powders. Appl. Spcctrosc. 2012, 66(5), 510–518.
  • Zafar, A.; Schjødt-Thomsen, J.; Sodhi, R.; Goacher, R.; Kubber, D.D. X−ray Photoelectron Spectroscopy and Time–of–flight Secondary Ion Mass Spectrometry Characterization of Aging Effects on the Mineral Fibers Treated with Aminopropylsilane and Quaternary Ammonium Compounds. Surf. Interface Anal. 2012, 44(7), 811–818.
  • Lee, K.; Kima, J.; Mok, I.-S.; Na, H.; Ko, D.-H.; Sohn, H.; Lee, S.; Sinclair, R. Reset–first Unipolar Resistance Switching Behavior in Annealed Nb2O5 Films. Thin Solid Films 2014, 558, 423–429.
  • Hryniewicz, T.; Rokosza, K.; Zschommler Sandimb, H.R. SEM/EDX and XPS Studies of Niobium after Electropolishing. Appl. Surf. Sci. 2012, 263, 357–361.
  • Bharti, D.C.; Rhee, S.W. Dielectric Properties and X–ray Photoelectron Spectroscopic Studies of Niobium Oxide Thin Films Prepared by Direct Liquid Injection Chemical Vapor Deposition Method. Thin Solid Films 2013, 548, 195–201.
  • Baek, H.; Lee, C.; Choi, J.; Cho, J. Nonvolatile Memory Devices Prepared from Sol−gel Derived Niobium Pentoxide Films. Langmuir 2013, 29(1), 380–386.
  • Mazura, M.; Szymańska, M.; Kaczmarek, D.; Kalisz, M.; Wojcieszak, D.; Domaradzki, J.; Placido, F. Determination of Optical and Mechanical Properties of Nb2O5 thin Films for Solar Cells Application. Appl. Surf. Sci. 2014, 301, 63–69.
  • Chen, L.; Sun, Q.-Q.; Gu, J.-J.; Xu, Y.; Ding, S.-J.; Zhang, D.W. Bipolar Resistive Switching Characteristics of Atomic Layer Deposited Nb2O5 Thin Films for Nonvolatile Memory Application. Curr. Appl. Phys. 2011, 11(3), 849–852.
  • Mou1dar, J.F.; Stickle, W.F.; Sobol, P.E.; Bomben, K.D. Handbook of X–ray Photoelectron Spectroscopy. Perkin−Elmer Corporation Press: Eden Prairie, Minnesota, 1992.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.