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General Papers

The Chemical Stain Inspection of Polysilicon Solar Cell Wafer by the Fuzzy Theory Method

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Pages 391-406 | Published online: 25 Mar 2013

References

  • Green , M. A. March 2003 . Crystalline and thin-film silicon solar cells: state of the art and future potential . Solar Energy , 74 ( 3 ) : 181 – 192 .
  • Lee , G. H. , Rhee , C. K. and Lim , K. S. February 2006 . A study on the fabrication of polycrystalline Si wafer by direct casting for solar cell substrate . Solar Energy , 80 ( 2 ) : 220 – 225 .
  • Schmich , E. , Schillinger , N. and Reber , S. September 2007 . Silicon CVD deposition for low cost applications in photovoltaics . Surface and Coatings Technology , 201 ( 22–23 ) : 9325 – 9329 .
  • Schirone , L. , Sotgiu , G. and Califano , F. P. April 1997 . Chemically etched porous silicon as an anti-reflection coating for high efficiency solar cells . Thin Solid Films , 297 ( 1–2 ) : 296 – 298 .
  • Barrio , R. , Maffiotte , C. , Gandía , J. J. and Cárabe , J. June 2006 . Surface characterisation of wafers for silicon-heterojunction solar cells . Journal of Non-Crystalline Solids , 352 ( 9–20 ) : 945 – 949 .
  • Bau , S. , Rentsch , J. , HuljiC , D. M. , Reber , S. , Hurrle , A. and Willeke , G. May 2003 . Application of screen printing processes for epitaxial silicon thin-film solar cells . 3rd World Conference on Photovoltaic Energy Conversion , 2 : 1356 – 1359 .
  • Istratov , A. A. , Hieslmair , H. , Vyvenko , O. F. , Weber , E. R. and Schindler , R. April 2002 . Defect recognition and impurity detection techniques in crystalline silicon for solar cells . Solar Energy Materials and Solar Cells , 72 ( 1–4 ) : 441 – 451 .
  • Arafune , K. , Sasaki , T. , Wakabayashi , F. , Terada , Y. , Ohshita , Y. and Yamaguchi , M. April 2006 . Study on defects and impurities in cast-grown polycrystalline silicon substrates for solar cells . Physica B: Condensed Matter , 376–377 : 236 – 239 .
  • Daami , A. , Zerrai , A. , Marchand , J. J. , Poortmans , J. and Brémond , G. February 2001 . Electrical defect study in thin-film SiGe/Si solar cells . Materials Science in Semiconductor Processing , 4 ( 1–3 ) : 331 – 334 .
  • Belyaev , A. , Polupan , O. , Ostapenko , S. , Hess , D. and Kalejs , J. P. January 2006 . Resonance ultrasonic vibration diagnostics of elastic stress in full-size silicon wafers . Semiconductor Science and Technology , 21 : 254 – 260 .
  • Li , Q. , Wang , W. , Ma , C. and Zhu , Z. September 2010 . Detection of physical defects in solar cells by hyperspectral imaging technology . Optics and Laser Technology , 42 ( 6 ) : 1010 – 1013 .
  • Hilmersson , C. , Hess , D. P. , Dallas , W. and Ostapenko , S. August 2008 . Crack detection in single-crystalline silicon wafers using impact testing . Applied Acoustics , 69 ( 8 ) : 755 – 760 .
  • Tsai , D. M. , Chang , C. C. and Chao , S. M. March 2010 . Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion . Image and Vision Computing , 28 ( 3 ) : 491 – 501 .
  • Zhang , Y. and Zhang , J. October 2005 . A Fuzzy neural network approach for quantitative evaluation of mura in TFT-LCD . 2005 International Conference on Neural Networks and Brain , 1 ( 13–15 ) : 424 – 427 .
  • LV , Y. , WU , M. , Lei , Q. and Nie , Z. Y. 2011 . Soft sensor based on a pso-bp neural network for a titanium billet furnace-temperature . Intelligent Automation and Soft Computing , 17 ( 8 ) : 1207 – 1216 .
  • Pan , W. J. , Jiang , C. Y. , Tang , Y. J. and Yang , S. X. 2011 . Tobacco dry weight estimation based on artificial neural network . Intelligent Automation and Soft Computing , 17 ( 7 ) : 997 – 1007 .
  • Egmont-Petersen , M. , de Ridder , D. and Handels , H. 2002 . Image processing with neural networks—a review . Pattern Recognition , 35 ( 10 ) : 2279 – 2301 .
  • Tizhoosh , H. R. 1998 . Fuzzy image processing: potentials and state of the art . 5th International Conference on Soft Computing , : 321 – 324 . Iizhka, Japan
  • Mendel , J. M. 1995 . Fuzzy logic systems for engineering: a tutorial . Proceedings of the IEEE , 83 ( 3 ) : 345 – 377 .
  • Chen , S. J. 2011 . Fuzzy information retrieval based on a new similarity measure of generalized fuzzy numbers . Intelligent Automation and Soft Computing , 17 ( 4 ) : 465 – 474 .
  • Franke , K. , Koppen , M. and Nickolay , B. 2000 . Fuzzy image processing by using dubois and prade fuzzy norms . 15th International Conference on Pattern Recognition , : 518 – 521 .
  • Lin , C. S. , Haun , C. M. , Hsien , F. S. , Yeh , M. S. , Chao , C. S. and Chen , R. 2011 . Application of laser speckle technology in solar wafer roughness inspection system . Indian Journal Of Pure & Applied Physics , 49 ( 8 ) : 523 – 530 .

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