140
Views
36
CrossRef citations to date
0
Altmetric
Original Articles

The origins and characteristics of negative capacitance in metal–insulator–metal devices

&
Pages 47-64 | Received 10 May 1991, Accepted 15 Jul 1991, Published online: 20 Aug 2006

References

  • Beale , M. I. J. 1990a . Royal Signals and Radar Establishment Memorandum No. 4401, 1990b, Acta Polytech. Scand., Appl. Phys. Ser., 170, 123; 1992a, Phil. Mag. B, 65, 65; 1992b (to be published)
  • Beale , M. I. J. , Kirton , J. and Slater , M. 1989 . “ Springer Proceedings in Physics ” . In Electroluminescence , Edited by: Shionoya , S. and Kobayashi , H. Vol. 38 , 296 – 300 . Berlin : Springer .
  • Blackmore , J. M. , Cattell , A. F. , Dexter , K. , Kirton , J. and Lloyd , P. 1987 . J. appl. Phys. , 61 : 714
  • Bracewell , R. 1986 . The Fourier Transform and its Applications , New York : McGraw-Hill . chap. 9
  • Cattell , A. F. , Inkson , J. C. and Kirton , J. 1987 . J. appl. Phys. , 61 : 722
  • Chaudhry , M. A. and Jonscher , A. K. 1988 . J. Mater. Sci. , 23 : 208
  • Jonscher , A. K. 1986 . J. chem. Soc., Faraday Trans. II , 82 : 75 J. chem. Soc., Faraday Trans. II, 82, 75
  • Sands , D. , Brunson , K. M. , Spink , D. M. , Thomas , C. B. , Mcneil , D. , Mcdonald , A. A. , Jennings , S. and Rosser , P. J. 1990 . J. Vac. Sci. Technol. B , 8 ( 1 )
  • Vogel , R. and Walsh , P. J. 1969 . Appl. Phys. Lett. , 216 : 7
  • Zaidi , S. H. and Jonscher , A. K. 1987 . Semicond. Sci. Technol , 2 : 587

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.