Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

References

• Burger A, Chen H, Chattopadhyay K, et al. Characterization of metal contacts on and surfaces of cadmium zinc telluride. Nucl Instruments Methods Phys Res Sect A Accel Spectrometers Detect Assoc Equip. 1999 Jun;428:8–13. 10.1016/S0168-9002(98)01574-5
   Web of Science ®Google Scholar
• Nelson AJ, Conway AM, Reinhardt CE, et al. X-ray photoemission analysis of passivated Cd(1 - x)ZnxTe surfaces for improved radiation detectors. Mater Lett. 2009 Jan;63:180–181. 10.1016/j.matlet.2008.09.051
   Web of Science ®Google Scholar
• Zheng Q, Dierre F, Franc J, et al. Investigation of generation of defects due to metallization on CdZnTe detectors. J Phys D Appl Phys. 2012 May;45:175102. 10.1088/0022-3727/45/17/175102
   Web of Science ®Google Scholar
• Gnatyuk VA, Vlasenko OI, Levytskyi SN, et al. Surface processing of CdZnTe crystals. Proc SPIE. 2012 Oct;8507:85071S. 10.1117/12.937953
   Google Scholar
• Crocco J, Bensalah H, Zheng Q, et al. Study of the effects of edge morphology on detector performance by leakage current and cathodoluminescence. IEEE Trans Nucl Sci, 2011;58:1935–1941. 10.1109/TNS.2011.2157703
   Web of Science ®Google Scholar
• Cui Y, Groza M, Burger A, et al. Effects of surface processing on the performance of Cdl-xZnxTe radiation detectors. IEEE Trans Nucl Sci. 2004 Jun;51:1172–1175. 10.1109/TNS.2004.829654
   Web of Science ®Google Scholar
• Duff MC, Hunter DB, Burger A, et al. Effect of surface preparation technique on the radiation detector performance of CdZnTe. Appl Surf Sci. 2008 Feb;254:2889–2892. 10.1016/j.apsusc.2007.10.064
   Web of Science ®Google Scholar
• Bensalah H, Plaza JL, Crocco J, et al. The effect of etching time on the CdZnTe surface. Appl Surf Sci. 2011 Mar;257:4633–4636. 10.1016/j.apsusc.2010.12.103
   Web of Science ®Google Scholar
• Marchini L, Zappettini A, Gombia E, et al. Study of surface treatment effects on the metal-CdZnTe interface. IEEE Trans Nucl Sci. 2009 Aug;56:1823–1826. 10.1109/TNS.2009.2022831
   Web of Science ®Google Scholar
• Hossain A, Bolotnikov AE, Camarda GS, et al. Effects of surface processing on the response of CZT gamma detectors: Studies with a collimated synchrotron X-ray beam. J Electron. Mater. 2008 Mar;37:1356–1361. 10.1007/s11664-008-0431-6
   Web of Science ®Google Scholar
• Bensouici A, Carcelen V, Plaza JL, et al. Study of effects of polishing and etching processes on Cd1-xZnxTe surface quality. J Cryst Growth. 2010;312:2098–2102. 10.1016/j.jcrysgro.2010.03.045
   Web of Science ®Google Scholar
• Tari S, Aqariden F, Chang Y, et al. Impact of surface treatment on the structural and electronic properties of polished CdZnTe surfaces for radiation detectors. J Electron Mater. 2013 Jun;42:3252–3258. 10.1007/s11664-013-2649-1
   Web of Science ®Google Scholar
• Xiaoqin W, Wanqi J, Qiang L, et al. Surface passivation of CdZnTe wafers. Mater Sci Semicond Process. 2005 Jan;8:615–621. 10.1016/j.mssp.2005.11.001
   Web of Science ®Google Scholar
• Choi SS, Lucovsky G. Native oxide formation on CdTe. J Vac Sci Technol B. 1988 Jul.;6:1198. 10.1116/1.584278
   Web of Science ®Google Scholar
• Yao HW, Erickson JC, Barber HB, et al. Optical properties of Cd0.9Zn0.1 Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV. J Electron Mater. 1999 Jun;28:760–765. 10.1007/s11664-999-0067-1
   Web of Science ®Google Scholar
• Badano G, Million A, Canava B, et al. Fast detection of precipitates and oxides on CdZnTe surfaces by spectroscopic ellipsometry. J Electron Mater. 2007 Jul;36:1077–1084. 10.1007/s11664-007-0176-7
   Web of Science ®Google Scholar
• Özsan ME, Sellin PJ, Veeramani P, et al. Chemical etching and surface oxidation studies of cadmium zinc telluride radiation detectors. Surf Interface Anal. 2010 Jan;42:795–798.
   Web of Science ®Google Scholar
• Zazvorka J, Franc J, Moravec P, et al. Contactless resistivity and photoconductivity correlation to surface preparation of CdZnTe. Appl Surf Sci. 2014 Oct;315:144–148.10.1016/j.apsusc.2014.07.104
   Web of Science ®Google Scholar
• Alruhaili A, Sellin PJ, Lohstroh A, et al. Performance characteristics of CdTe drift ring detector. J Instrum. 2014 Mar;9:C03029–C03029.
   Web of Science ®Google Scholar
• Duarte DD, Bell SJ, Lipp J, et al. Edge effects in a small pixel CdTe for X-ray imaging. J Instrum. 2013 Oct;8:P10018–P10018.
   Web of Science ®Google Scholar
• Fujiwara H. Spectroscopic ellipsometry: principles and applications. Chichester, UK: John Wiley & Sons; 2007.
   Google Scholar
• Bahl MK, Watson RL, Irgolic KJ. X-ray photoemission studies of tellurium and some of its compounds. J Chem Phys. 1977 Aug;66:5526.
   Web of Science ®Google Scholar
• Cabrera N, Mott NF. Theory of the oxidation of metals. Reports Prog Phys. 1948;12:163–184.
   Web of Science ®Google Scholar
• Morita M, Ohmi T, Hasegawa E, et al. Growth of native oxide on a silicon surface. J Appl Phys. 1990;68:1272–1281.
   Web of Science ®Google Scholar
• Franc J, Grill R, Hlidek P, et al. Mapping of zinc content in Cd1-xZnxTe by optical methods. J Electron Mater. 2006;35:1491–1494.
   Web of Science ®Google Scholar