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Philosophical Magazine Volume 87, 2007 - Issue 35

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Original Articles

Microstructure and shape memory behaviour of annealed Ti_51.5Ni_(48.5-_x₎Cu_x (x = 6.5–20.9) thin films

A. Ishida National Institute for Materials Science, Sensor Materials Center, Tsukuba, JapanCorrespondence[email protected]

M. Sato National Institute for Materials Science, Sensor Materials Center, Tsukuba, Japan

Pages 5523-5538 | Received 18 May 2007, Accepted 29 Aug 2007, Published online: 12 Nov 2007

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https://doi.org/10.1080/14786430701654394

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Microstructure and shape memory behaviour of annealed Ti_51.5Ni_(48.5-_x₎Cu_x (x = 6.5–20.9) thin films

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Microstructure and shape memory behaviour of annealed Ti51.5Ni(48.5-x)Cux (x = 6.5–20.9) thin films

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Microstructure and shape memory behaviour of annealed Ti_51.5Ni_(48.5-_x₎Cu_x (x = 6.5–20.9) thin films