References
- Hutchison , JL , Titchmarsh , JM , Cockayne , DJH , Doole , RC , Hetherington , CJD , Kirkland , AI and Sawada , H . 2005 . Ultramicroscopy , 103 : 7
- Kirkland , AI , Titchmarsh , JM , Hutchison , JL , Cockayne , DJH , Hetherington , CJD , Doole , RC , Sawada , H , Haider , M and Hartel , P . 2004 . JEOL News , 39 : 2
- Tsuno , K , Kaneyama , T , Honda , T , Tsuda , K , Terauchi , M and Tanaka , M . 1997 . J. Electron Microsc. , 46 : 357
- Rose , H . 1990 . Optik , 85 : 19
- Haider , M , Rose , H , Uhlemann , S , Schwan , E , Kabius , B and Urban , K . 1998 . Ultramicroscopy , 75 : 53
- Hartel , P , Müller , H , Uhlemann , S and Haider , M . 2004 . in Proceedings of EMC 2004, Antwerp , : 41
- Kirkland , AI and Meyer , RR . 2004 . Microsc. Microanal. , 10 : 1
- Haigh , S , Sawada , H and Kirkland , AI . 2009 . Phil. Trans. Proc. Roy. Soc A , 367 : 3755
- Cervera Gontard , L , Chang , L-Y , Hetherington , CJD , Kirkland , AI , Ozkaya , D and Dunin-Borkowski , RE . 2007 . Angew. Chem. , 46 : 3683
- Dellby , N , Krivanek , OL , Nellist , PD , Batson , PE and Lupini , AR . 2001 . J. Electron Microsc. , 50 : 177
- Haider , M , Uhlemann , S and Zach , J . 2000 . Ultramicroscopy , 81 : 163
- Nellist , PD and Pennycook , SJ . 2000 . Adv. Imag. Electron Phys. , 113 : 148
- Winkelman , GB , Dwyer , C , Hudson , TS , Nguyen-Manh , D , Doblinger , M , Satet , RL , Hoffmann , MJ and Cockayne , DJH . 2005 . Appl. Phys. Lett. , 87 : 061911
- LeBeau , JM and Stemmer , S . 2008 . Ultramicroscopy , 108 : 1653
- LeBeau , JM , Findlay , SD , Allen , LJ and Stemmer , S . 2008 . Phys. Rev. Lett. , 100 : 4
- Nellist , PD , Lozano-Perez , S and Ozkaya , D . 2010 . Proceedings of EMAG2009 , IOP Publishing .
- Nellist , PD . 2008 . Science of Microscopy , Edited by: Hawkes , PW and Spence , JCH . 65 – 132 . New York : Springer .
- Meyer , RR and Kirkland , AI . 1998 . Ultramicroscopy , 75 : 23
- Frigo , SP , Levine , ZH and Zaluzec , NJ . 2002 . Appl. Phys. Lett. , 81 : 2112
- Born , M and Wolf , E . 1980 . Principles of Optics , Oxford : Pergamon Press .
- Van Benthem , K , Lupini , AR , Kim , M , Baik , HS , Doh , S , Lee , J-H , Oxley , MP , Findlay , SD , Allen , LJ , Luck , JT and Pennycook , SJ . 2005 . Appl. Phys. Lett. , 87 : 034104
- Borisevich , AY , Lupini , AR and Pennycook , SJ . 2006 . Proc. Natl. Acad. Sci. USA , 103 : 3044
- Behan , G , Cosgriff , EC , Kirkland , AI and Nellist , PD . 2009 . Phil. Trans. Roy. Soc. Lond. A , 367 : 3825
- Cosgriff , EC , D'Alfonso , AJ , Allen , LJ , Findlay , SD , Kirkland , AI and Nellist , PD . 2008 . Ultramicroscopy , 108 : 1558
- D’Alfonso , AJ , Cosgriff , EC , Findlay , SD , Behan , G , Kirkland , AI , Nellist , PD and Allen , LJ . 2008 . Ultramicroscopy , 108 : 1567
- Einspahr , JJ and Voyles , PM . 2006 . Ultramicroscopy , 106 : 1041
- Xin , HLL and Muller , DA . 2009 . J. Electron Microsc. , 58 : 157
- Nellist , PD , Behan , G , Kirkland , AI and Hetherington , CJD . 2006 . Appl. Phys. Lett. , 89 : 124105
- Wang , P , Behan , G , Takeguchi , M , Hashimoto , A , Mitsuishi , K , Shimojo , M , Kirkland , AI and Nellist , PD . 2010 . Phys. Rev. Lett. , 104 : 200801
- Takeguchi , M , Hashimoto , A , Shimojo , M , Mitsuishi , K and Furuya , K . 2008 . J. Electron Microsc. , 57 : 123