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Correspondence

Observation of crystal defects using the scanning electron microscope

Pages 973-979 | Received 10 Aug 1971, Published online: 20 Aug 2006

References

  • Booker , G. R. 1970 . Modern Diffraction and Imaging Techniques in Materials Science , Edited by: Amelinckx , S. , Gevers , R. , Remaut , G. and Van Landuyt , J. North-Holland .
  • Clarke , D. R. and Howie , A. 1971 . Phil. Mag. , 24 : 959
  • Crewe , A. V. and Wall , J. 1970 . Optik, Berl. , 30 : 461

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