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Original Articles

TED pattern studies of the structure of post-annealed amorphous silicon layers on single crystal silicon

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Pages 1373-1380 | Received 10 Aug 1976, Accepted 07 Jan 1977, Published online: 13 Sep 2006

References

  • Brodsky , M. H. , Title , R. S. , Weiser , K. and Pettit , G. D. 1970 . Phys. Rev. B , 1 : 2632
  • Hirsch , P. B. , Howie , A. , Nicholson , R. B. , Pashley , D. W. and Whelan , M. J. 1965 . Electron Microscopy of Thin Crystals 141 London, Washington, D.C. : Butterworths .
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  • Moss , S. C. and Graczyk , J. F. 1969 . Phys. Rev. Lett. , 23 : 1167
  • Pashley , D. W. and Stowell , M. J. 1963 . Phil. Mag. , 8 : 1605

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