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Original Articles

Enhancement in Electrical Conductance of Pt Decorated Multiwalled Carbon Tubes Using Electron Beam-Induced Deposition Technique

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Pages 371-375 | Received 05 Jan 2014, Accepted 05 Mar 2014, Published online: 10 Sep 2014

References

  • Zhu, H. W., Xu, C. L., Wu, D. H., Wei, B. Q., Vajtai, R., and Ajayan, P. M. (2002) Strands. Sci., 296–884.
  • Chen, L., Xie, H., and Yu, W. (2012) J. Mater Sci., 47–5590.
  • Chico, L., Crespi, V. H., Benedict, L. X., Lourie, S. G., and Cohen, M. L (1996) Phys. Rev. Lett., 76–971.
  • Li, J. H., Lu, G. W., Li, J. J., Bai, X. D., and Gu, C. Z. (2005) Phys. Rev. Lett., 95–086601.
  • Andriotis, A, Menon, M, and Gibson, H. (2008) IEEE Sens., 8–910.
  • Liang, Y. X., Li, Q. H., and Wang, T. H. (2004) Appl. Phys. Lett., 84–3379.
  • Collins, P. G., Hersam, M., Arnold, M., Martel, R., and Avouris, P. (2001) Phys. Rev. B, 86–3128.
  • Kulshrestha, N., Misra,. A., Bajpai, R., Roy, S., and Misra, D. S. (2012) IEEE Trans. on Nanotech., 11–830.
  • Kim, S., Kulkarni, D. D., Rykaczewski, K., Henry, M., Tsukruk, V. V, and Fedorov, A. G. (2012) IEEE Trans. on Nanotech., 1–1223.
  • Pablo, P. J. de, Graungnard, E., Walsh, B., Andres, R. P., Datta, S., and Reifenberger, R. (1999) Appl. Phys. Lett., 74–323.
  • Kulshrestha, N., Misra, A., Srinivasan, S., Hazra, K. S., Bajpai, R., Roy, S., Aidya, G., and Misra, D. S. (2010) Appl. Phy. Lett., 97–222102.
  • Terrones, M. (2003) Annu. Rev. Mater Res., 33–419.
  • Bittencourt, C., Ke, X., Tendeloo, V. G., Thiess, S., Drube, W., Ghijsen, J., and Ewels, C. P. (2012) Chem. Phys. Lett. 535–580.
  • Quintana, M., Ke, X., Tendeloo, V. G., Meneghetti, M., Bittencourt, C., and Prato, M. (2010) ACS Nano., 4–6105.
  • Hussain, S., Jha, P., Chouksey, A., Raman, R., Islam, S. S., Islam, T., and Choudhray, P. K. (2011) J. Mod. Phys., 2–538.
  • Espino, E. G., Sala, G., Pino, F., Halonen, N., Luomahaara, J., Maklin, J.,Toth, G., Korda, K., Jantunen, H., Terrones, M., Helisto, P., Seppa, H., Ajayan, P. M., and Vajtai, R. (2010) ACS Nano., 4–3318.
  • Dhall, S., Jaggi, N., and Nathawat, R. (2013) Sen. And Actu., A201–A321.
  • Lau, H. C., Cervini, R., Clarke, S. R., Markovic, M. G., Matisons, J. G., Hawkins, S. C., Huynh, C. P., and Simon, G. P. (2008) J. Nanoparticle Res., 10–77.
  • Yazdanpanah, M. M., Chakraborty, S., Harfenist, S. A., Cohn, R. W., and Alphenaar, B. W. (2004) Appl. Phys. Lett., 85–3564.
  • Kumar, S., Kaur, I., Dharamvir, K., and Bharadwaj, L. M. (2012) J. Coll. Inter. Sci., 369–23.
  • Kim, Y. L., Li, B., An, X., Hahm, M. G., Chen, L., Washungton, M., Ajayan, P. M., Nayak, S. K., Busnaina, A., Kar, S., and Jung, Y. J. (2006) ACS Nano, 3–2818.
  • Shiraishi, M., and Ata, M. (2000) Carbon, 39–1913.
  • Shan, B., Lakatos, G. W., Peng, S., and Cho, K. (2005) Appl. Phys. Lett., 87–173109.
  • Umeno, Y., Kitamura, T., and Kushima, A. (2004) Comput. Mater. Sci., 30–283.
  • Banhart, F. (2009) Nanoscale, 1–201.

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