INVESTIGATION OF REFRACTIVE INDICES OF FREE-STANDING FILMS BY ELLIPSOMETRY

Y. Okumoto Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-2188, Japan

M. Kimura Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-2188, Japan

T. Akahane Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-2188, Japan

N. Matsuhashi Department of Electrical Engineering, Hachinohe National College of Technology, Hachinohe, Aomori 039-1104, Japan

M. Yoshida Musashi Institute of Technology, Setagaya, Tokyo 158-8557, Japan

T. Tadokoro J. A. Woollam Japan Corp., Suginami, Tokyo 167-0051, Japan

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