References
- Oversluizen, G., Klein, M., de Zwart, S., van Heusden, S., & Dekker, T. (2002). J. Appl. Phys., 91(4), 2403–2408.
- Saito, A., Maeda, T., Tone, M., Shiga, T., Mikoshiba, S., & Oversluizen, G. (2004). SID ‘04, 602, 210–213, Seattle, USA, May 2004.
- Lee, B.H., Chung, W.J., Kim, T.J., Kim, T.S., Seok, J.G., & Jung Y.S. (2009). SID ‘09, 40, 54–57.
- Jung, H.Y., Lee, T.H., Kwon, O., & Whang, K.W. (2009). SID ‘09, 40, 58–61.
- Tae, H.S., Cho, K.D., Jang, S.H., & Choi, K.C. (2001). IEEE Trans. Electron Devices, 48(7), 1469–1472.
- Lee, D.S., Ok, J.W., Lee, H.J., Lee, H.J., Kim, D.H., & Park, C.H. (2004). IDW ‘04, 11, 977–980.
- Hirakawa, H., Katayama, T., Kuroki, S., Kanae, T., Nakahara, H., Nanto, T., Yoshikawa, K., Otsuka, A., & Wakitani, M. (1998). SID ‘98, 29, 279–282.
- Kanagu, S., Kanazawa, Y., Shinoda, T., Yoshikawa, K., & Nanto, T. (1992). SID ‘92, 23, 713–716.
- Sakita, K., Takayama, K., Awamoto, K., & Hashimoto, Y. (2001). SID ‘01, 32, 1022–1025.
- Sakita, K., Takayama, K., Awamoto, K., & Hashimoto, Y. (2003). J. Soc. Info. Display, 11(1), 139–114.