References
- Qin, Z., et al. (2016). Sid Symposium Digest of Technical Papers, 47.1, 393–396.
- Hung, L. S., & Tang C W, et al. (2001). Appl. Phys. Lett., 78, 544.
- Hung, L. S., Tang, C. W., & Mason, M. G. (1997). Appl. Phys. Lett., 70, 152–154.
- Yang, J., et al. (2014). Journal of Nanoscience & Nanotechnology, 14.8, 5898–5902.
- Gu, G., et al. (1996). Appl. Phys. Lett., 68, 2606.
- Han, S., et al. (2003). Appl. Phys. Lett., 82, 2715.
- Pode, R. B., et al. (2004). Appl. Phys. Lett., 84, 4614.
- Chen, B. J., et al. (2005). Opt. Exp., 13, 937.
- Wei, B., et al. (2007). Semiconductor Science and Technology, 22(7), 788–792.
- Huang, Z. H., et al. (2009). Thin Solid Films, 517(17), 4810–4813.
- Rim, Y. S., et al. (2009). Journal of the Korean Physical Society, 3, 54.
- The thermodynamic data is from NIST Chemistry WebBook, http://webbook.nist.gov.
- Mason, M. G., et al. (2001). Appl. Phys., 89, 2756–2765.
- Shabasy, M. E., et al. (1990). Journal of Materials Science, 25(1), 585–588.
- Chen, B. J., et al. (2005). Opt. Exp., 13, 937.