Registration of AFM and SEM Scans Using Local Features

REFERENCES

• Bastanlar , Yalin , Alptekin Temizel , and Yasemin Yardimci . 2010 . Improved SIFT matching for image pairs with a scale difference . IET Electronics Letters 46 ( 5 ): 346 – 348 .
   Google Scholar
• Bay , Herbert , Andreas Ess , Tinne Tuytelaars , and Luc Van Gool . 2008 . Speeded-Up robust features (SURF) . Comput. Vis. Image Underst. 110 ( 3 ): 346 – 359 .
   Web of Science ®Google Scholar
• Beis , Jeffrey S. , and David G. Lowe . 1997 . Shape Indexing Using Approximate Nearest-Neighbour Search in High-Dimensional Spaces. Proc. IEEE Conf. on Computer Vision and Pattern Recognition pp. 1000-1006 .
   Google Scholar
• Binnig , Gerd , Calvin Forrest Quate , and Christoph Gerber . 1986 . Atomic force microscope . Phys. Rev. Letters 56 ( 9 ): 930 – 933 .
   PubMed Web of Science ®Google Scholar
• Capel , David. 2004 . Image mosaicing and super-resolution . London : Springer .
   Google Scholar
• Fan , Yuan , Qian Chen , Shiva Arun-Kumar , Andrew D. Baczewski , Nick V. Tram , Virginia M. Ayres , Lalita Udpa , and Alan F. Rice . 2006 . Registration of tapping and contact mode atomic force microscopy images. Sixth IEEE Conference on Nanotechnology (IEEE-NANO) 1: 193-196 .
   Google Scholar
• Fischler , Martin A. , and Robert C. Bolles . 1981 . Random sample consensus: A paradigm for model fitting with applications to image analysis and automated cartography . Commun. ACM 24 ( 6 ): 381 – 395 .
   Web of Science ®Google Scholar
• Gnieser , Dominic , Carl G. Frase , Harald Bosse , and Rainer Tutsch . 2009 . Model-based correction of image distortion in scanning electron microscopy. Proc. of 9th Int. Symp. on Measurement Technology and Intelligent Instruments (ISMTII) 1: 1–147–1–151 .
   Google Scholar
• Gonzalez , Rafael C. , Richard E. Woods , and Steven L. Eddins . 2004 . Digital image processing using MATLAB . Upper Saddle River , NJ : Prentice Hall .
   Google Scholar
• Goshtasby , Arthur Ardeshir . 2005 . 2-D and 3-D image registration . Hoboken , NJ : Wiley-Interscience .
   Google Scholar
• Joachimsthaler , Ingo , Ralf Heiderhoff , and Ludwig Josef Balk . 2003 . A universal scanning-probe-microscope based hybrid system . Measurement Science and Technology 14 ( 1 ): 87 – 96 .
   Google Scholar
• Lagarias , Jeffrey C. , James A. Reeds , Margaret H. Wright , and Paul E. Wright . 1998 . Convergence properties of the Nelder–Mead simplex method in low dimensions . SIAM J. on Optimization 9 ( 1 ): 112 – 147 .
   Web of Science ®Google Scholar
• Lowe , David G. 2004 . Distinctive image features from scale-invariant keypoints . International Journal of Computer Vision 60 ( 2 ): 91 – 110 .
   Web of Science ®Google Scholar
• Mick , Uwe , Volkmar Eichhorn , Tim Wortmann , Claas Diederichs , and Sergej Fatikow . 2010 . Combined nanorobotic AFM/SEM system as novel toolbox for automated hybrid analysis and manipulation of nanoscale objects. IEEE Int. Conf. on Robotics and Automation (ICRA) pp. 4088–4093 .
   Google Scholar
• Mikolajczyk , Krystian , and Cordelia Schmid . 2005 . A performance evaluation of local descriptors . Pattern Analysis and Machine Intelligence, IEEE Transactions 27 ( 10 ): 1615 – 1630 .
   PubMed Web of Science ®Google Scholar
• Mikolajczyk , Krystian , Tinne Tuytelaars , Cordelia Schmid , Andrew Zisserman , Jiri Matas , Frederik Schaffalitzky , Timor Kadir , and Luc Van Gool . 2005 . A comparison of affine region detectors . International Journal of Computer Vision 65 ( 1/2 ): 43 – 72 .
   Web of Science ®Google Scholar
• Poletti , Giulio , Francesco Orsini , Cristina Lenardi , and Emanuele Barborini . 2003 . A comparative study between AFM and SEM imaging on human scalp hair . Journal of Microscopy 211 ( 3 ): 249 – 255 .
   PubMedGoogle Scholar
• Reimer , Ludwig. 1998 . Scanning electron microscopy: Physics of image formation and microanalysis . Berlin , DE : Springer .
   Google Scholar
• Seeger , Adam. 2004 . Surface reconstruction from AFM and SEM images . PhD thesis , University of North Carolina .
   Google Scholar
• Tarasenko , Olga , Said Nourbakhsh , Spencer P. Kuo , Asya Bakhtina , Pierre Alusta , Dina Kudasheva , Mary Cowman , and Kalle Levon . 2006. Scanning electron and atomic force microscopy to study plasma torch effects on b. cereus spores. IEEE Transactions on Plasma Science 34 (4): 1281–1289.
   Google Scholar
• Wei , Qufu , Dan Tao , Weidong Gao , and Yubo Huang . 2008 . Scanning electron microscopy and atomic force microscopy of composite nanofibres . Microscopy and Analysis 22 ( 2 ): 11 – 12 .
   Google Scholar
• Wortmann , Tim. 2009 . Fusion of afm and sem scans. Proc. of Int. Symposium on Optomechatronic Technologies (ISOT) pp. 40–45 .
   Google Scholar
• Wortmann , Tim. 2010 . Automatic stitching of micrographs using local features. Proc. of Int. Symposium on Optomechatronic Technologies (ISOT). SP-MNM-2 .
   Google Scholar
• Wortmann , Tim , and Sergej Fatikow . 2009 . Carbon nanotube detection by scanning electron microscopy. Proc. of the Eleventh IAPR Conference on Machine Vision Applications (MVA) pp. 370–373 .
   Google Scholar
• Zhou , Yi , and Mohammed Omar . 2009 . Pixel-level fusion for infrared and visible acquisitions . Int. Journal of Optomechatronics 3 ( 1 ): 41 – 53 .
   Web of Science ®Google Scholar
• Zhu , Yuan Yuan , Gu Qiao Ding , Jian Ning Ding , and Ning Yi Yuan . 2010 . AFM, SEM and TEM studies on porous anodic alumina . Nanoscale Research Letters 5 ( 4 ): 725 – 734 .
   PubMedGoogle Scholar