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Original Articles

Effects of base vacuum level on discharge characteristics in vacuum in‐line sealing process for high efficient PDP

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Pages 7-11 | Received 19 Nov 2004, Accepted 17 Dec 2004, Published online: 22 Nov 2010

References

  • Kwon , S. J. , Hong , K. C. , Sung , J. H. , Lee , C. H. , Whang , K. W. , Yoon , C. K. and Lee , J. D. 2000 . J. Korean Phys. Soc. , 37 : 247
  • Kwon , S. J. , Yang , H. C. and Whang , K. W. 2003 . J. Vac. Sci. Tech. A , 21 : 206
  • Oversluizen , G. , Zwart , S. , Gillies , M. F. , Dekker , T. and Vink , T. J. 2004 . Microelectronics J. , 35 : 319
  • Choi , E. H. , Oh , H. J. , Kim , Y. G. , Ko , J. J. , Lim , J. Y. , Kim , J. G. , Kim , D. I. , Cho , G. S. and Kang , S. O. 1998 . Jpn. J. Appl. Phys. , 37 : 7015
  • Saito , A. , Maeda , T. , Tone , M. , Shiga , T. and Mikoshiba , S. 2004 . SID Digest , : 210
  • Yu , Z. N. , Seo , J. W. , Yu , S. J. , Zheng , D. X. and Sun , J. 2002 . Surf. Coatings Tech. , 162 : 11
  • Shin , J.H. and Park , C. H. 2002 . J. of KIEEME , 15 : 909
  • Members, KIDS

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