References
- E.F. Schubert and N.E.J. Hunt, Appl. Phys. A. 66, 319 (1998). doi: 10.1007/s003390050672
- X.A. Cao and S.D. Arthur, Appl. Phys. Lett. 85, 3971 (2004). doi: 10.1063/1.1810631
- L.-C. Chen and Y.-L. Huang, Solid-state Electron. 48, 1239 (2004). doi: 10.1016/j.sse.2004.02.003
- E.F. Schubert, Light-Emitting Diodes (Cambridge University Press, Cambridge, UK, 2003).
- M. Koike, N. Shibata, H. Kato and Y. Takahashi, IEEE J. Sel. Top. Quantum Electron. 8, 271 (2002). doi: 10.1109/2944.999180
- S.J. Chang, W.C. Lai, Y.K. Su, J.F. Chen, C.H. Liu and U.H. Liaw, IEEE J. Sel. Top. Quantum Electron. 8, 278 (2002). doi: 10.1109/2944.999181
- L. Wang, S. Feng, C. Guo and G. Zhang, presented at the IEEE Proceedings of 16th IPFA, 2009, p. 472.
- L. Yang, J. Hu and M.W. Shin, Solid-State Electron. 53, 567 (2009). doi: 10.1016/j.sse.2009.03.014
- X. Luo, B. Wu and S. Liu, IEEE Trans. Device Mater. Reliab. 10 (2) (2010).
- F. Wu, W. Zhao, S. Yang, and C. Zhang, presented at the Electronic Measurement & Instruments of ICEMI ’09, 2009, p. 4–978.
- M. Meneghini, L.R. Trevisanello, G. Meneghesso and E. Zanoni, IEEE Trans. Device Mater. Reliab. 8 (2) (2008).
- S.-L. Kuo, C.-K. Liu, M.-J. Dai, C.-K. Yu, H.-C. Chien and C.-Y. Hsu, presented at the Electronics Packaging Technology Conference(EPTC) 2008. 10th, p. 149.
- H. Wong and W.H. Lam, Electron Devices Meeting, 2001. Proceedings 2001 IEEE Hong Kong (2001), p. 38.
- H. Masui, S. Nakamura and S.P. DenBaars, Appl. Phys. Lett. 96, 073509 (2010). doi: 10.1063/1.3318285
- J.M. Kang, J.H. Choi, D.H. Kim, J.W. Kim, Y.S. Song, G.H. Kim and S.K. Han, IEEE Electron. Dev. Lett. 29, 1118 (2008). doi: 10.1109/LED.2008.2002749
- Global Standards for the Microelctronics Industry. http://www.jedec.org/download/search/jesd51-1.pdf
- M. Meneghini, S. Podda, A. Morelli, R. Pintus, L. Trevisanello, G. Meneghesso, M. Vanzi and E. Zanoni, Microelectron. Reliab. 46, 1720 (2006). doi: 10.1016/j.microrel.2006.07.050
- J.M. Shah, Y.-L. Li, Th. Gessmann and E.F. Schubert, J. Appl. Phys. 94 (4), 15 (2003). doi: 10.1063/1.1593218
- D. Zhu, J. Xu, A.N. Noemaun, J.K. Kim, E. Fred Schubert, Mary H. Crawford and Daniel D. Koleske, Appl. Phys. Lett. 94, 081113 (2009). doi: 10.1063/1.3089687
- M. Meneghini, S. Podda, A. Morelli, R. Pintus, L. Trevisanello, G. Meneghesso, M. Vanzi and E. Zanoni, Microelectro Reliab 46, 1720 (2006). doi: 10.1016/j.microrel.2006.07.050
- L.X. Zhao, E.J. Thrush, C.J. Humphreys and W.A. Phillips, J. Appl. Phys. 103, 024501 (2008). doi: 10.1063/1.2829781
- L. Jayasinghe, Y. Gu and N. Narendran, Proceedings of SPIE, 6337, 63370V (2006).