66
Views
9
CrossRef citations to date
0
Altmetric
Original Articles

The Effect of Estimated Parameters on Poisson EWMA Control Charts

, &
Pages 513-527 | Received 01 Mar 2005, Accepted 01 Mar 2006, Published online: 09 Feb 2016

References

  • Roberts, S. W. (1959). Control chart tests based on geometric moving averages. Technometrics, 1, 239–250.
  • Montgomery, D. C. (2006). Introduction to Statistical Quality Control, 6th ed. John Wiley and Sons, New York, NY.
  • Brook, D. and Evans, D. A. (1972). An approach to the probability distribution of CUSUM run length. Biometrika, 59, 539–549.
  • Lucas, J. M. (1985). Counted data CUSUM’s. Technometrics, 27, 129–144.
  • White, C. H. and Keats, J. B. (1996). ARLs and higher-order run-length moments for the poisson CUSUM. Journal of Quality Technology, 28, 363–369.
  • White, C. H., Keats, J. B. and Stanley, J. (1997). Poisson CUSUM vs. c-chart for defect rate. Quality Engineering, 9, 673–679.
  • Gan, F. F. (1989). Monitoring Poisson observations using modified exponentially weighted moving average control charts. Communications in Statistics and Simulation, 19, 103–124.
  • Borrar, C. M., Champ, C. W. and Rigdon, S. E. (1998). Poisson E WMA control charts. Journal of Quality Technology, 30, 352–361.
  • Borror, C. M., Keats, J. B. and Montgomery, D. C. (2000). Robustness of the time between events CUSUM. International Journal of Production Research 41, 3435–3444.
  • Gan, F. F. (1992). Exact run length distribution for One-Sided Exponential CUSUM Schemes. Statistica Sinica, 2, 297–312.
  • Gan, F. F. (1994). Design of Optimal Exponential CUSUM control charts. Journal of QualityTechnology, 26, 109–124.
  • Champ, C. W. and Rigdon, S. E. (1991). A comparison of the Markov chain and the integral equation approaches for evaluating the run length distribution of quality control charts. Communication in Statistics — Simulation and Computation, 20, 191–204.
  • Chao, M. T. (2000). Applications of Markov chains in quality-related matters in Statistical Process Monitoring and Optimization, edited by S. H. Park, and G. G. Vining, Marcel-Dekker, New York, 175–188.
  • Crowder, S. V. (1987a). Computation of ARL for combined individual measurement and moving range charts. Journal of Quality Technology, 19, 98–102.
  • Crowder, S. V. (1987b). A program for the computation of ARL for combined individual measurement and moving range charts. Journal of Quality Technology, 19, 103–106.
  • Fu, J. C., Spiring, F.A. and Xie, H. (2002). On the average run lengths of quality control schemes using a Markov chain approach. Statistics & Probability Letters, 56, 369–380.
  • Lucas, J. M. and Saccucci, M. S. (1990). Exponentially weighted moving average control Schemes: properties and enhancements. Technometrics, 32, 1–12.
  • Reynold, M. R. (1975). Approximations to the average run length in cumulative sum control charts. Technometrics, 25, 295–301.
  • Robinson, P. B. and Ho, T. Y. (1978). Average run lengths of geometric moving average charts by numerical methods. Technometrics, 20, 85–93.
  • Saccucci, M. S. and Lucas, J. M. (1990). Average run lengths for exponentially moving average control schemes using the Markov chain approach. Journal of Quality Technology, 22, 154–158.
  • Vardeman, S. and Ray, D. (1985). Average run lengths for CUSUM when observations are exponentially distributed. Technometrics, 27, 145–150.
  • Waldmann, K. H. (1986). Bounds for the distribution of the run length of one-sided and two-sided CUSUM quality control schemes. Technometrics, 28, 61–67.
  • Woodall, W. H. (1983). The distribution of run length of one-sided CUSUM procedures for continuous random variables. Technometrics, 25, 295–301.
  • Woodall, W. H. (1984). On the Markov chain approach to the two-sided CUSUM procedure. Technometrics, 26, 41–46.
  • Jones, L. A. (2002). The statistical design of EWMA control charts with estimated parameters. Journal of Quality Technology, 34, 277–288.
  • Jones, L. A., Champ, C. W. and Rigdon, S. E. (2001). The performance of exponentially weighted moving average charts with estimated parameters. Technometrics, 43, 156–167.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.