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Quality Technology & Quantitative Management Volume 15, 2018 - Issue 3
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Original Articles

Two-sided tolerance intervals for members of the (log)-location-scale family of distributions

Miao YuanDepartment of Statistics, Virginia Tech, Blacksburg, VA, USA.
,
Yili HongDepartment of Statistics, Virginia Tech, Blacksburg, VA, USA.Correspondence[email protected]
,
Luis A. EscobarDepartment of Experimental Statistics, Louisiana State University, Baton Rouge, LA, USA.
&
William Q. MeekerDepartment of Statistics, Iowa State University, Ames, IA, USA.
Pages 374-392 | Accepted 17 Aug 2016, Published online: 06 Sep 2016

References

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