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Original Articles

Two-sided tolerance intervals for members of the (log)-location-scale family of distributions

, , &
Pages 374-392 | Accepted 17 Aug 2016, Published online: 06 Sep 2016

References

  • Bergquist, M. L. (2006). Caution using bootstrap tolerance limits with application to dissolution specification limits (Ph.D. thesis). North Carolina State University, Raleigh, NC.
  • Eberhardt, K. R., Mee, R. W., & Reeve, C. P. (1989). Computing factors for exact two-sided tolerance limits for a normal distribution. Communications in Statistics -- Simulation and Computation, 18, 397–413.
  • Hahn, G. J., & Meeker, W. Q. (1991). Statistical intervals -- A guide for practitioners. New York, NY: John Wiley & Sons.
  • Howe, W. G. (1969). Two-sided tolerance limits for normal populations -- Some improvements. Journal of the American Statistical Association, 64, 610–620.
  • Howlader, H. A., & Weiss, G. (1992). Log-logistic survival estimation based on failure-censored data. Journal of Applied Statistics, 19, 231–240.
  • Krishnamoorthy, K., & Mathew, T. (2009). Statistical tolerance regions -- Theory, applications, and computation. Hoboken, NJ: John Wiley & Sons.
  • Krishnamoorthy, K., Mathew, T., & Ramachandran, G. (2006). Generalized p-values and confidence intervals: A novel approach for analyzing lognormally distributed exposure data. Journal of Occupational and Environmental Hygiene, 3, 642–650.
  • Krishnamoorthy, K., & Xie, F. (2011). Tolerance intervals for symmetric location-scale families based on uncensored or censored samples. Journal of Statistical Planning and Inference, 141, 1170–1182.
  • Lawless, J. F. (2003). Statistical models and methods for lifetime data. Hoboken, NJ: John Wiley & Sons.
  • Martz, H. F., & Waller, R. A. (1982). Bayesian reliability analysis. New York, NY: John Wiley & Sons.
  • Meeker, W. Q., & Escobar, L. A. (1998). Statistical methods for reliability data. New York, NY: John Wiley & Sons.
  • Nelson, W. (1982). Applied life data analysis. New York, NY: John Wiley & Sons.
  • Odeh, R. E., & Owen, D. B. (1980). Tables for normal tolerance limits, sampling plans, and screening. New York, NY: Marcel Dekker.
  • Shyu, J., & Owen, D. B. (1986a). One-sided tolerance intervals for the two-parameter double exponential distribution. Communications in Statistics -- Simulation and Computation, 15, 101–119.
  • Shyu, J., & Owen, D. B. (1986b). Two-sided tolerance intervals for the two-parameter double exponential distribution. Communications in Statistics -- Simulation and Computation, 15, 479–495.
  • Weissberg, A., & Beatty, G. H. (1960). Tables of tolerance-limit factors for normal distributions. Technometrics, 2, 483–500.
  • Xie, Y., Hong, Y., Meeker, W. Q., & Escobar, L. A. (2014). Simultaneous prediction intervals for members of the (log)-location-scale family of distributions. Statistics Preprints, Paper 128. Retrieved from http://lib.dr.iastate.edu/stat_las/128

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