Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution

References

• Alhadeed, A. A., & Yang, S. S. (2005). Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Transactions on Reliability, 54(1), 64–68. https://doi.org/10.1109/TR.2004.841704
   Web of Science ®Google Scholar
• Bai, D. S., Cha, M. S., & Chung, S. W. (1992). Optimal simple ramp-tests for the Weibull distribution and type-I censoring. IEEE Transactions on Reliability, 41(3), 407–413. https://doi.org/10.1109/24.159808
   Web of Science ®Google Scholar
• Bai, D. S., & Kim, M. S. (1993). Optimal simple step-stress accelerated life tests for Weibull distribution and type I censoring. Naval Research Logistics, 40(2), 193–210. https://doi.org/10.1002/1520-6750(199303)40:2<193::AID-NAV3220400205>3.0.CO;2-J
   Web of Science ®Google Scholar
• Bai, D. S., Chun, Y. R., & Cha, M. S. (1997). Time-censored ramp tests with stress bound for Weibull life distribution. IEEE Transactions on Reliability, 46(1), 99–107. https://doi.org/10.1109/24.589934
   Web of Science ®Google Scholar
• Balakrishnan, N., Kundu, D., Ng, H. K. T., & Kannan, N. (2007). Point and interval estimation for a simple step-stress model with type-II censoring. Journal of Quality Technology, 39(1), 35–47. https://doi.org/10.1080/00224065.2007.11917671
   Web of Science ®Google Scholar
• Chernoff, H. (1953). Locally optimal designs for estimating parameters. The Annals of Mathematical Statistics, 24(4), 586–602. https://doi.org/10.1214/aoms/1177728915
   Google Scholar
• Khamis, I. H., & Higgins, J. J. (1998). A new model for step-stress testing. IEEE Transactions on Reliability, 47(2), 131–134. https://doi.org/10.1109/24.722275
   Web of Science ®Google Scholar
• Kim, S. H., & Yum, B. J. (2009) Optimal design of accelerated life tests under cyclic-stress loading: The case of lognormal lifetime distribution, in Proceedings of APIEMS 2009, Kitakyushu, Japan: APIEMS. pp. 1570–1577.
   Google Scholar
• Lawless, J. F. (1982). Statistical models and methods for lifetime data. John Wiley & Sons.
   Google Scholar
• Lee, J., & Pan, R. (2010). Analyzing step-stress accelerated life testing data using generalized linear models. IIE Transactions, 42(8), 589–598. https://doi.org/10.1080/07408170903459976
   Web of Science ®Google Scholar
• Liao, H., & Elsayed, E. A. (2005) Accelerated life testing under cyclic stress loadings. Presented at The thirteenth Industrial Engineering Research Conference, Atlanta, GA.
   Google Scholar
• Lin, Z., & Fei, H. (1991). A nonparametric approach to progressive stress accelerated life testing. IEEE Transactions on Reliability, 40(2), 173–176. https://doi.org/10.1109/24.87123
   Web of Science ®Google Scholar
• Meeker, W. Q., & Hahn, G. J. (1985). How to plan an accelerated life test-some practical. In Guidelines, The ASQC basic references in quality control: Statistical techniques. Vol. 10. ASQC Press.
   Google Scholar
• Meeker, W. Q. (1986). Planning life tests in which units are inspected for failure. IEEE Transactions on Reliability, 35(5), 571–578. https://doi.org/10.1109/TR.1986.4335550
   Web of Science ®Google Scholar
• Meeker, W. Q., & Escobar, L. A. (1993). A review of recent research and current issues in accelerated testing. International Statistical Review / Revue Internationale de Statistique, 61(1), 147–168. https://doi.org/10.2307/1403600
   Web of Science ®Google Scholar
• Meeker, W. Q., & Escobar, L. A. (1998). Statistical methods for reliability data. John Wiley & Sons.
   Google Scholar
• Meeter, C. A., & Meeker, W. Q. (1994). Optimum accelerated life tests with a nonconstant scale parameter. Technometrics, 36(1), 71–83.
   Web of Science ®Google Scholar
• Mettas, A., & Vassiliou, P. (2002) Modeling and analysis of time-dependent stress accelerated life data, in Proceedings of the Annual Reliability and Maintainability Symposium, Seattle, WA, pp. 343–348.
   Google Scholar
• Miller, R., & Nelson, W. (1983). Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability, R-32(1), 59–65. https://doi.org/10.1109/TR.1983.5221475
   Web of Science ®Google Scholar
• Nelson, W., & Kielpinski, T. J. (1976). Theory for optimum censored accelerated life tests for normal and lognormal life distributions. Technometrics, 18(1), 105–114. https://doi.org/10.2307/1267923
   Web of Science ®Google Scholar
• Nelson, W., & Meeker, W. Q. (1978). Theory for optimum censored accelerated tests for Weibull and extreme value distribution. Technometrics, 20(2), 171–177. https://doi.org/10.1080/00401706.1978.10489643
   Web of Science ®Google Scholar
• Nelson, W. (1990). Accelerating test: Statistical models, test plans and data analysis. John Wiley & Sons.
   Google Scholar
• Nelson, W. B. (2005a). A bibliography of accelerated test plans. IEEE Transactions on Reliability, 54(2), 194–197. https://doi.org/10.1109/TR.2005.847247
   Web of Science ®Google Scholar
• Nelson, W. B. (2005b). A bibliography of accelerated test plans Part II- references. IEEE Transactions on Reliability, 54(3), 370–373. https://doi.org/10.1109/TR.2005.853289
   Web of Science ®Google Scholar
• Nelson, W. B. (2008). Residuals and their analyses for accelerated life tests with step and varying stress. IEEE Transactions on Reliability, 57(2), 360–368. https://doi.org/10.1109/TR.2008.920789
   Web of Science ®Google Scholar
• O’Connor, P., & Kleyner, A. (2012). Practical reliability engineering. John Wiley & Sons.
   Google Scholar
• Park, H. G. (1991) Three-level constant stress accelerated life test plans with a fixed ratio of allocations to high and middle levels: The case of Weibull lifetime distribution. MS thesis, Korea Advanced Institute of Science and Technology.
   Google Scholar
• Park, J. W., & Yum, B. J. (1996). Optimal design of accelerated life tests with two stresses. Naval Research Logistics, 43(6), 863–884. https://doi.org/10.1002/(SICI)1520-6750(199609)43:6<863::AID-NAV5>3.0.CO;2-2
   Web of Science ®Google Scholar
• Park, J. I., & Yum, B. J. (1997). Optimal design of accelerated degradation tests for estimating mean lifetime at the use condition. Engineering Optimization, 28(3), 199–230. https://doi.org/10.1080/03052159708941132
   Web of Science ®Google Scholar
• Ratnaparkhi, M. V., & Park, W. J. (1986). Lognormal distribution-model for fatigue life and residual strength of composite materials. IEEE Transactions on Reliability, 35(3), 312–315. https://doi.org/10.1109/TR.1986.4335440
   Web of Science ®Google Scholar
• Seo, S. K., & Yum, B. J. (1991). Accelerated life test plans under intermittent inspection and type-I censoring: The case of Weibull failure distribution. Naval Research Logistics, 38(1), 1–22. https://doi.org/10.1002/1520-6750(199102)38:1<1::AID-NAV3220380103>3.0.CO;2-3
   Web of Science ®Google Scholar
• Shyur, H. J., Elsayed, E. A., & Luxhøj, J. T. (1999). A general model for accelerated life testing with time-dependent covariates. Naval Research Logistics, 46(3), 303–321. https://doi.org/10.1002/(SICI)1520-6750(199904)46:3<303::AID-NAV4>3.0.CO;2-4
   Web of Science ®Google Scholar
• Xu, A., & Tang, Y. (2015a). Reference optimality criterion for planning accelerated life testing. Journal of Statistical Planning and Inference, 167, 14–26. https://doi.org/10.1016/j.jspi.2015.06.002
   Web of Science ®Google Scholar
• Xu, A., & Tang, Y. (2015b). A Bayesian method for planning accelerated life testing. IEEE Transactions on Reliability, 64(4), 1383–1392. https://doi.org/10.1109/TR.2015.2436374
   Web of Science ®Google Scholar
• Yin, X.-K., & Sheng, B.-Z. (1987). Some aspects of accelerated life testing by progressive stress. IEEE Transactions on Reliability, R-36(1), 150–155. https://doi.org/10.1109/TR.1987.5222320
   Web of Science ®Google Scholar
• Zhao, Y. X., Qing, G., & Wang, J. N. (2000). An approach for determining an appropriate assumed distribution of fatigue life under limited data. Reliability Engineering & System Safety, 67(1), 1–7. https://doi.org/10.1016/S0951-8320(99)00036-8
   Web of Science ®Google Scholar
• Zhao, W., & Elsayed, E. A. (2005). A general accelerated life model for step-stress testing. IIE Transactions, 37(11), 1059–1069. https://doi.org/10.1080/07408170500232396
   Web of Science ®Google Scholar
• Zhao, W., Pan, R., Aron, A., & Mettas, A. (2006). Some properties of confidence bounds on reliability estimation for parts under varying stresses. IEEE Transactions on Reliability, 55(1), 7–17. https://doi.org/10.1109/TR.2005.858091
   Web of Science ®Google Scholar
• Zhao, Y. X., Bing, Y., & Peng, J. C. (2007). Reconstruction of probabilistic SN curves under fatigue life following lognormal distribution with given confidence. Applied Mathematics and Mechanics, 28(4), 455–460. https://doi.org/10.1007/s10483-007-0405-z
   Google Scholar