References
- Bergström, L.: Hamaker constants of inorganic materials, Advances in Colloid and Interface Science, 70, 1997, 125–169. http://dx.doi.org/10.1016/S0001-8686(97)00003-1.
- Butt, H. J.; Cappella, B.; and Kappl, M.: Force measurements with the atomic force microscope: technique, interpretation and applications, Surface Science Reports, 59(1), 2005, 1–152. http://dx.doi.org/10.1016/j.surfrep.2005.08.003.
- Cappella, B.; Baschieri, P.; Frediani, C.; Miccoli, P.; Ascoli, C.: Force-distance curves by AFM, Engineering in Medicine and Biology Magazine, IEEE, 16(2), 1997, 58–65. http://dx.doi.org/10.1109/51.582177.
- Cappella, B.; Dietler, G.: Force-distance curves by atomic force microscopy, Surface Science Reports, 34(1), 1999, 1–104. http://dx.doi.org/10.1016/S0167-5729(99)00003-5.
- Derjaguin, B. V.; Muller, V. M.; Toporov, Y. P.: Effect of contact deformations on the adhesion of particles, Journal of Colloid and Interface Science, 53(2), 1975, 314–326. http://dx.doi.org/10.1016/0021-9797(75)90018-1.
- Fok, L. M.; Liu, Y. H.; Li, W. J.: Haptic sensing and modeling of nanomanipulation with an AFM, IEEE International Conference on Robotics and Biomimetics, 2004, 452–457. http://dx.doi.org/10.1109/ROBIO.2004.1521821.
- Hao, H. W.; Baro, A. M.; Saenz, J. J.: Electrostatic and contact forces in force microscopy, Journal of Vacuum Science & Technology B, 9(2), 1991, 1323–1328. http://dx.doi.org/10.1116/1.585188.
- Hillier, A. C.; Kim, S.; Bard, A. J.: Measurement of double-layer forces at the electrode/electrolyte interface using the atomic force microscope: potential and anion dependent interactions, The Journal of Physical Chemistry, 100(48), 1996, 18808–18817. http://dx.doi.org/10.1021/jp961629k
- Li, G.; Xi, N.; Yu, M.; Fung, W. K.: Development of augmented reality system for AFM-based nanomanipulation, IEEE/ASME Transactions on Mechatronics, 9(2), 2004, 358–365. http://dx.doi.org/10.1109/TMECH.2004.828651.
- Meurk, A.; Luckham, P. F.; Bergström, L.: Direct measurement of repulsive and attractive van der Waals forces between inorganic materials, Langmuir, 13(14), 1997, 3896–3899. http://dx.doi.org/10.1021/la9610967.
- Millet, G.; Lécuyer, A.; Burkhardt, J. M.; Haliyo, D. S.; Régnier, S.: Improving perception and understanding of nanoscale phenomena using haptics and visual analogy, Haptics: Perception, Devices and Scenarios, Springer Berlin Heidelberg, 2008, 847–856.
- Pawluk, D.; Taylor, C.; Hoffman, M.; McClintock, M.: Development of a nanoscale virtual environment haptic interface for teaching nanotechnology to individuals who are visually impaired, in the Proceedings of American Society for Engineering Education Annual Conference & Exposition, Austin, TX, 2009, June 14–17.
- Peng, X.: Interactive freeform solid modeling with haptic interface, Ph. D. Thesis, Missouri University of Science and Technology, Rolla, MO, 2005.
- Sitti, M.; Hashimoto, H.: Teleoperated touch feedback from the surfaces at the nanoscale: modeling and experiments, IEEE/ASME Transactions on Mechatronics, 8(2), 2003, 287–298. http://dx.doi.org/10.1109/TMECH.2003.812828.