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Articles

Feature extraction for defect classification and yield enhancement in color filter and micro-lens manufacturing: An empirical study

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Pages 510-517 | Received 20 Oct 2013, Accepted 10 Nov 2013, Published online: 12 Dec 2013

References

  • Breiman, L., J. H. Freidman, R. A. Olshen and C. J. Stone, Classification and Regression Trees, Wadsworth & Brooks/Cole Advanced Books & Softward, Pacific Grove, CA (1984).
  • Canny, J., “A computational approach to edge detection,” IEEE Transactions on Pattern Analysis and Machine Intelligence, 8, 679–698 (1986).
  • Chauhan, S. S. and J. M. Proth, “Analysis of a supply chain partnership with revenue sharing,” International Journal of Production Economics, 97, 44–51 (2005).
  • Chien, C.-F., Y.-J. Chen, C.-Y. Hsu and H.-K. Wang, “Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller,” IEEE Transactions on Automation Science and Engineering, in press.
  • Chien, C.-F., S.-C. Hsu and Y.-J. Chen, “A System for online detection and classification of wafer bin map defect patterns for manufacturing intelligence,” International Journal of Production Research, 51, 2324–2338 (2013).
  • Chou, P. B., A. R. Rao, M. C. Sturzenbecker, F. Y. Wu and V. H. Brecher, “Automatic defect classification for semiconductor manufacturing,” Machine Vision and Applications, 9, 201–214 (1997).
  • Hani, A. F. M., A. S. Malik, R. Kamil and C.-M. Thong, “A Review of SMD-PCB Defects and Detection Algorithms,” Proceedings of SPIE, 8350, 1–7 (2012).
  • Hsu, S.-C. and C.-F. Chien, “Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing,” International Journal of Production Economics, 107, 88–103 (2007).
  • Jiang, B. C., C. C. Wang and P. L. Chen, “Logistic regression tree applied to classify PCB golden finger defects,” The International Journal of Advanced Manufacturing Technology, 24, 496–502 (2004).
  • Jiang, B. C., C.-C. Wang and H.-C. Liu, “Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques,” International Journal of Production Research, 43, 67–80 (2005).
  • Kuo, C.-J., C.-F. Chien and C.-D. Chen, “Manufacturing intelligence to exploit the value of production and tool data to reduce cycle time,” IEEE Transactions on Automation Science and Engineering, 8, 103–111 (2011).
  • Kuo, C.-F., C.-T. M. Hsu, C.-H. Fang, S.-M. Chao and Y.-D. Lin, “Automatic defect inspection system of colour filters using Taguchi-based neural network,” International Journal of Production Research, 51, 1464–1476 (2013).
  • Li, W.-C. and D.-M. Tsai, “Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection,” IEEE Transactions on Industrial Informatics, 7, 136–147 (2011).
  • Li, W.-C. and D.-M. Tsai, “Wavelet-based defect detection in solar wafer images with inhomogeneous texture,” Pattern Recognition, 45, 742–756 (2012).
  • Liu, C.-W. and C.-F. Chien, “An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing,” Engineering Applications of Artificial Intelligence, 26, 1479–1486 (2013).
  • Tasi, D.-M., “Automatic visual inspection for surface defects,” Keynote speech on 2012 International Symposium on Semiconductor Manufacturing Intelligence (ISMI2012) & 2012 Decision Analysis Symposium (DAS2012), Jan. 6–8, Hsinchu, Taiwan (2012).
  • Tsai, D.-M. and J.-Y. Luo, “Mean shift-based defect detection in multicrystalline solar wafer surfaces,” IEEE Transactions on Industrial Informatics, 7, 125–135 (2011).
  • Tsai, D.-M. and H.-Y. Tsai, “Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis,” Machine Vision and Applications, 22, 629–649 (2011).
  • Tsai, D.-M., S.-C. Wu and W.-Y. Chiu, “Defect detection in solar modules using ICA basis images,” IEEE Transactions on Industrial Informatics, 9, 122–131 (2013).
  • Tsai, D.-M., S.-C. Wu and W.-C. Li, “Defect detection of solar cells in electroluminescence images using Fourier image reconstruction image reconstruction,” Solar Energy Materials & Solar Cells, 99, 250–262 (2012).
  • Tseng, D.-C., I.-L. Chung, P.-L. Tsai and C.-M. Chou, “Defect classification for LCD color filters using neural-network decision tree classifier,” International Journal of Innovative Computing Information and Control, 7, 3695–3707 (2011).
  • Xie, X., “A review of recent advances in surface defect detection using texture analysis techniques,” Electronic Letters on Computer Vision and Image Analysis, 7, 1–22 (2008).

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