A cost-effective and reliable measurement strategy for 3D printed parts by integrating low- and high-resolution measurement systems

References

• Baribeau, R. and Rioux, M. (1991) Influence of speckle on laser range finders. Applied Optics, 30(20), 2873–2878.
   Web of Science ®Google Scholar
• Bešić, I., van Gestel, N., Kruth, J.P., Bleys, P. and Hodolič, J. (2011) Accuracy improvement of laser line scanning for feature measurements on CMM. Optics and Lasers in Engineering, 49(11), 1274–1280.
   Web of Science ®Google Scholar
• Bochmann, L., Bayley, C., Helu, M., Transchel, R., Wegener, K. and Dornfeld, D. (2015) Understanding error generation in fused deposition modeling. Surface Topography: Metrology and Properties, 3(1), e014002. http://iopscience.iop.org/article/10.1088/2051-672X/3/1/014002/meta
   Web of Science ®Google Scholar
• Chan, D., Kohn, R., Nott, D. and Kirby, C. (2006) Locally adaptive semiparametric estimation of the mean and variance functions in regression models. Journal of Computational and Graphical Statistics, 15(4), 915–936.
   Web of Science ®Google Scholar
• Colosimo, B.M. and Pacella, M. (2007) On the use of principal component analysis to identify systematic patterns in roundness profiles. Quality and Reliability Engineering International, 23(6), 707–725.
   Web of Science ®Google Scholar
• Colosimo, B.M., Pacella, M. and Senin, N. (2015) Multisensor data fusion via Gaussian process models for dimensional and geometric verification. Precision Engineering, 40, 199–213.
   Web of Science ®Google Scholar
• Del Castillo, E., Colosimo, B.M. and Tajbakhsh, S.D. (2015) Geodesic Gaussian processes for the parametric reconstruction of a free-form surface. Technometrics, 57(1), 87–99.
   Web of Science ®Google Scholar
• El-Katatny, I., Masood, S.H. and Morsi, Y.S. (2010) Error analysis of FDM fabricated medical replicas. Rapid Prototyping Journal, 16(1), 36–43.
   Web of Science ®Google Scholar
• Feng, H.Y., Liu, Y. and Xi, F. (2001) Analysis of digitizing errors of a laser scanning system. Precision Engineering, 25(3), 185–191.
   Web of Science ®Google Scholar
• Geweke, J. (1992) Evaluating the accuracy of sampling-based approaches to the calculation of posterior moments. in J. M. Bernardo, J. Berger, A. P. Dawid, and A. F. M. Smith (eds.), Bayesian Statistics 4, pp. 169–193. Oxford University Press, Oxford, U.K. http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.27.2952
   Google Scholar
• Gibson, I., Rosen, D.W. and Stucker, B. (2010) Additive Manufacturing Technologies, Springer, New York, NY.
   Google Scholar
• Huang, Q., Nouri, H., Xu, K., Chen, Y., Sosina, S. and Dasgupta, T. (2014) Statistical predictive modeling and compensation of geometric deviations of three-dimensional printed products. Journal of Manufacturing Science and Engineering, 136(6), e061008. http://manufacturingscience.asmedigitalcollection.asme.org/article.aspx?articleid=1903282
   Web of Science ®Google Scholar
• Huang, Q., Zhang, J., Sabbaghi, A. and Dasgupta, T. (2015) Optimal offline compensation of shape shrinkage for three-dimensional printing processes. IIE Transactions, 47(5), 431–441.
   Web of Science ®Google Scholar
• Kennedy, M.C. and O’Hagan, A. (2000) Predicting the output from a complex computer code when fast approximations are available. Biometrika, 87(1), 1–13.
   Web of Science ®Google Scholar
• Liu, J.S. (2001) Monte Carlo Strategies in Scientific Computing, Springer, New York, NY.
   Google Scholar
• Murphy, K.P. (2012) Machine Learning: A Probabilistic Perspective, MIT Press, London, UK.
   Google Scholar
• Oravecz, Z., Huentelman, M. and Vandekerckhove, J. (2017), Sequential Bayesian Updating for Big Data, in M. Jones (ed.), Big Data in Cognitive Science, pp. 13–33. Psychology Press, Sussex, UK.
   Google Scholar
• Qian, P.Z. and Wu, C.J. (2008) Bayesian hierarchical modeling for integrating low-accuracy and high-accuracy experiments. Technometrics, 50(2), 192–204.
   Web of Science ®Google Scholar
• Ramsay, J.O. (2006) Functional Data Analysis, John Wiley & Sons, New York, NY.
   Google Scholar
• Shen, T.S., Huang, J. and Menq, C.H. (2000) Multiple-sensor integration for rapid and high-precision coordinate metrology. IEEE/ASME Transactions on Mechatronics, 5(2), 110–121.
   Web of Science ®Google Scholar
• Steiner, S.H. (2000) Statistical process control using two measurement systems. Technometrics, 42(2), 178–187.
   Web of Science ®Google Scholar
• Van Gestel, N., Cuypers, S., Bleys, P. and Kruth, J.P. (2009) A performance evaluation test for laser line scanners on CMMs. Optics and Lasers in Engineering, 47(3), 336–342.
   Web of Science ®Google Scholar
• Wang, A., Song, S., Huang, Q. and Tsung, F. (2016) In-plane shape-deviation modeling and compensation for fused deposition modeling processes. IEEE Transactions on Automation Science and Engineering, 14(2), 968–976.
   Web of Science ®Google Scholar
• Wang, J., Pagani, L., Leach, R.K., Zeng, W., Colosimo, B.M. and Zhou, L. (2017) Study of weighted fusion methods for the measurement of surface geometry. Precision Engineering, 47, 111–121.
   Web of Science ®Google Scholar
• Weckenmann, A., Jiang, X., Sommer, K.D., Neuschaefer-Rube, U., Seewig, J., Shaw, L. and Estler, T. (2009) Multisensor data fusion in dimensional metrology. CIRP Annals-Manufacturing Technology, 58(2), 701–721.
   Web of Science ®Google Scholar
• Wohlers, T.T. (2013) Wohlers Report 2013: Additive Manufacturing and 3D Printing State of the Industry: Annual Worldwide Progress Report, Wohlers Associates, Inc., Fort Collins, CO.
   Google Scholar
• Xia, H., Ding, Y. and Mallick, B.K. (2011) Bayesian hierarchical model for combining misaligned two-resolution metrology data. IIE Transactions, 43(4), 242–258.
   Web of Science ®Google Scholar
• Yau, P. and Kohn, R. (2003) Estimation and variable selection in nonparametric heteroscedastic regression. Statistics and Computing, 13(3), 191–208.
   Web of Science ®Google Scholar
• Yuan, M. and Wahba, G. (2004) Doubly penalized likelihood estimator in heteroscedastic regression. Statistics & Probability Letters, 69(1), 11–20.
   Web of Science ®Google Scholar