An Improved Iem Model for Bistatic Scattering From Rough Surfaces

A.K. Fung Wave Scattering Research Center Department of Electrical Engineering University of Texas at Arlington, Box 19016, USA

W.Y. Liu Department of Electrical Engineering National Central University, Chung-Li, Taiwan

K.S. Chen Center for Space and Remote Sensing Research National Central University, Chung-Li, Taiwan

M.K. Tsay Department of Electrical Engineering National Central University, Chung-Li, Taiwan

References

Fung , A. K. 1994 . Scatterircg and Emission Models and Their Applications , Artech House .
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Hsieh , C. Y. and Fung , A. K. 1999 . Application of an extended IEM to multiple surface scattering and backscatter enhancement . J. Electromagnetic Waves and Applications , 13 : 121 – 135 .
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Alvarez-Perez , J. 2001 . An extension of the IEM/IEMM surface scattering model . Waves in Random Media , 11 : 307 – 329 .
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Ulaby , F. T. , Moore , R. K. and Fung , A. K. 1982 . Microwave Remote Sensing , Vol. 2 , Artech House .
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Sancer , M. I. 1969 . Shadow corrected electromagnetic scattering from a randomly rough surface . IEEE Trans. Antennas Propagat. , AP-17 : 577 – 589 .
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An Improved Iem Model for Bistatic Scattering From Rough Surfaces

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