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Journal of Electromagnetic Waves and Applications Volume 23, 2009 - Issue 5-6
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Articles

Measurement of Dielectric Constant of Thin Film Materials at Microwave Frequencies

H. Jin Department of Information Science & Electronic Engineering, Zhejiang University, Hangzhou 310027, P. R. China
,
S. R. Dong Department of Information Science & Electronic Engineering, Zhejiang University, Hangzhou 310027, P. R. China;, Email: [email protected]
&
D. M. Wang Department of Information Science & Electronic Engineering, Zhejiang University, Hangzhou 310027, P. R. China
Pages 809-817 | Published online: 03 Apr 2012

References

  • Fiedziuszko , S. J. and Hunter , I. 2002 . Dielectric materials, devices and circuits . IEEE Trans. Microwave Theory Tech. , 50 ( 3 ) : 706 – 720 .
  • Bao , P. , Jackson , T. J. and Jancaster , M. J. 2008 . Dielectric characterization of a ferroelectric film in the sub-GHz region . J. Phys. D: Appl. Phys. , 41 ( 18 ) : 185410
  • Jinesh , K. B. , Klootwijk , J. H. , Lamy , Y. , Wolters , R. , Tois , E. , Tuominen , M. , Roozeboom , F. and Besling , W. F. A. 2008 . Enhanced electrical properties of atomic layer deposited La2O3 thin films with embedded ZrO2 nanocrystals . Appl. Phys. Lett. , 93 ( 17 ) : 172904
  • Bogle , A. , Havrilla , M. , Nyquis , D. , Kempel , L. and Rothwell , E. 2005 . Electromagnetic material characterization using a partially filled rectangular waveguide . Journal of Electromagnetic Wave and Applications , 19 ( 10 ) : 1291 – 1306 .
  • Chuang , B. K. 2007 . Dielectric constant measurement for thin material at microwave frequencies . Progress In Electromagnetics Research , PIER 75 : 239 – 252 .
  • Kumar , A. and Sharma , S. 2007 . Measurement of dielectric constant and loss factor of the dielectric material at microwave frequencies . Progress In Electromagnetics Research , PIER 69 : 47 – 54 .
  • Huang , R. F. and Zhang , D. M. 2007 . Application of mode matching method to analysis of axisymmetric coaxial discontinuity structures used in permeability and/or permittivity measurement . Progress In Electromagnetics Research , PIER 67 : 205 – 230 .
  • Qian , C. and Dou , W. B. 2005 . A new approach for measuring permittivity of dielectric materials . Journal of Electromagnetic Wave and Applications , 19 ( 6 ) : 795 – 810 .
  • Pozar , D. M. 2005 . Microwave Engineering , 3rd edition , New York : John Wiley & Sons .
  • Sucher , M. and Fox , J. 1963 . Handbook of Microwave Measurements , 3rd Ed. , New York : Polytechnic Institute of Brooklyn .
  • Thomas , R. and Dube , D. C. 1997 . Extended technique for complex measurement of dielectric films in the microwave region . Electronics Letters , 33 ( 3 ) : 218 – 220 .

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