20
Views
1
CrossRef citations to date
0
Altmetric
Articles

Broad-Band Simultaneous Measurement of Complex Permittivity and Permeability for Uniaxial or Isotropic Materials Using a Coaxial Discontinuity

&
Pages 1225-1245 | Published online: 03 Apr 2012

References

  • Miles , P. A. , W. B. , Westphal and von Hippel , A. 1957 . Dielectric spectroscopy of ferromagnetic semiconductors . Rev. Modern Phys. , 29 July : 279 – 307 .
  • Von Hippel , A. 1961 . Les Dielectriques et leurs applications , Paris : Dunod .
  • Sucher , M. and Fox , J. 1963 . Handbook of Microwave Measurements , Third Ed. , Vol. 2 , New York : Wiley & Sons .
  • Weir , W. B. 1974 . Automatic measurement of complex dielectric constant and the permeability at microwave frequencies . Proc. IEEE , 62 Jan. : 33 – 36 .
  • Barry , W. 1986 . A broad-band, automated, stripline technique for the simultaneous measurement of complex permittivity and permeability . IEEE Trans. Microwave Theory Tech. , MTT-34 Jan. : 80 – 84 .
  • Aulock , W. V. and Rowen , J. H. 1957 . Measurement of dielectric and magnetic properties of ferromagnetic materials at microwave frequencies . Bell Syst. Tech. J. , 36 ( No. 2 ) : 427 – 448 .
  • Bussey , H. E. and Steinart , L. A. 1957 . An exact solution for a cylindrical cavity containing a gyromagnetic material . Proc. IRE , IM-32 ( No. 2 ) May
  • Damaskos , N. J. , Mack , R. B. , Maffett , A. L. , Parmon , W. and Uslenghi , P. L. E. 1984 . The inverse problem for biaxial materials . IEEE Trans. Microwave Theory Tech. , MTT-32 Apr. : 400 – 405 .
  • Hashimoto , O. and Shimuzi , Y. 1986 . Reflecting characteristics of anisotropic rubber sheets and measurements of the complex permittivity tensor . IEEE Trans. Microwave Theory Tech. , MTT-34 Nov. : 1202 – 1207 .
  • Parneix , J. P. , Legrand , C. and Toutain , S. 1982 . Automatic permittivity measurements in a wide frequency range: application to anisotropic fluid . IEEE Trans. Microwave Theory Tech. , MTT-30 Nov. : 2015 – 2017 .
  • Belhadj-Tahar , N. E. and Fourrier-Lamer , A. 1986 . Broad-band analysis of a coaxial discontinuity used for dielectric measurements . IEEE Trans. Microwave Theory Tech. , MTT-34 Mar. : 346 – 350 .
  • Belhadj-Tahar , N. E. , Fourrier-Lamer , A. and de Chanterac , H. 1990 . Broad-band simultaneous measurement of complex permittivity and permeability using a coaxial discontinuity . IEEE Trans. Microwave Theory Tech. , MTT-38 Jan. : 1 – 7 .
  • Belhadj-Tahar , N. E. and Fourrier-Lamer , A. 1991 . Broad-band simultaneous measurement of the complex permittivity tensor for uniaxial materials using a coaxial discontinuity . IEEE Trans. Microwave Theory Tech. , MTT-39 Oct.
  • Kong , J. A. and Cheng , D. K. 1968 . On guided waves in moving anisotropic media . IEEE Trans. Microwave Theory Tech. , MTT-16 Feb. : 99 – 103 .
  • Chang , C. T. M. 1972 . Circular waveguides lined with artificial anisotropic dielectrics . IEEE Trans. Microwave Theory Tech. , MTT-20 Aug. : 517 – 523 .
  • Abramowitz , M. and Stegun , I. A. Handbook of Mathematical Functions , 369 – 370 . Washington, DC : Government Printing Office, National Bureau of Standards . Ch. 9, Sect. 4
  • Belhadj-Tahar , N. E. and Fourrier-Lamer , A. 1988 . Utilisation pratique d'une cellule très large bande pour la mesure automatique de la permittivité de divers matériaux . L'Onde Electrique , 68 Jan. : 50 – 59 .
  • Masterman , P. H. and Clarricoats , P. J. B. 1971 . Computer field-matching solution of waveguide transverse discontinuities . Proc. IEE , 118 Jan. : 51 – 63 .
  • English , W. J. 1973 . The circular waveguide step-discontinuity mode transducer . IEEE Trans. Microwave Theory Tech. , MTT-21 Oct. : 633 – 636 .
  • Gitzen , W. H. 1970 . Alumina as a ceramic material . American Ceramic Society , 78
  • Van Heuven , J. H. C. and Vlek , T. H. A. M. 1972 . Anisotropy in alumina substrates for microstrip circuits . IEEE Trans. Microwave Theory Tech. , MTT-20 Nov. : 775 – 777 .
  • Aitken , J. E. , Ladbrooke , P. H. and Potok , M. H. N. 1975 . Microwave measurement of the temperature coefficient of permittivity for sapphire and alumina . IEEE Trans. Microwave Theory Tech. , MTT-23 June : 526 – 529 .
  • Hewlett-Packard . Measuring dielectric constants with the H.P. 8510 Network Analyzer , Hewlett-Packard Product Note 8510–3
  • Baker-Jarvis , J. , Vanzura , E. J. and Kissick , W. A. 1990 . Improved technique for determining complex permittivity with the transmission/reflection method . IEEE Trans. Microwave Theory Tech. , MTT-38 Aug. : 1096 – 1103 .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.