19
Views
8
CrossRef citations to date
0
Altmetric
Articles

Sidewall Surface Roughness of Sputtered Silicon I: Surface Modelling

, , &
Pages 97-103 | Published online: 19 Jul 2013

  • M. Y. ALI and N. P. HUNG: Mater. Manuf Process., 2001,16, (3), 297— 313.
  • M. Y. ALI and N. P. HUNG: Mater. Manuf Process. , 2001,16, (3), 315— 329.
  • N. P. HUNG, M. Y. ALI, Y. Q. FU, N. S. ONG and M. L. TAY: Mach. ScL Technot, 2001, 5, (2), 239–254.
  • R. NASSAR, M. J. VASILE and W. ZHANG: J. Vac. ScL Technot B, 1998, 16, (1), 109–115.
  • M. J. VASILE, J. XIE and R. NASSAR: J. Vac. ScL TechnoL B, 1999, 17, (6), 3085–3090.
  • M. Y. ALI, N. P. HUNG and S. YUAN: Proc. Int. Conf. on ‘Precision engineering’, 535-540; 2000, Singapore, Gintic Institute of Manufacturing Technology.
  • L. WEBER, W. EHRFELD, H. FERIMUTH, M. LACHER, H. LEHR and B. PECH: Proc. Int. Conf. on ‘Micromachining and microfabri-cation process technology II', (SPIE 2879), 156-167; 1996, Bellingham, WA, SPIE.
  • R. RUPRECHT, W. BACHER, J. H. HAUBELT and V. POITTER: Proc. Int. Conf. on ‘Micromachining and microfabrication process technology', (SPIE 2639), 146-157; 1995, Bellingham, WA, SPIE.
  • H. LORENZ, M. DESPONT, P. VETTIGER and P. RENAUD: Microsystem Technot, 1997, 4, 143–146.
  • S. FATIKOW and R. REMBOLD: ‘Microsystem technology and microrobotics', 91-108; 1997, Germany, Springer.
  • W. EHRFELD and H. LEHR: Radiat Phys. Chem., 1995, 45, (3), 349— 365.
  • W. EHRFELD, H. LEHR, F. MICHEL and A. WOLF: Proc. Int. Conf. on ‘Micromachining and microfabrication process tech-nology II', (SPIE 2879), 332-337; 1996, Bellingham, WA, SPIE.
  • T. MASUZAWA, M. FUJINO and K. KOBAYASHI: Ann. mt. Inst. Prod. Eng. Res. (CIRP), 1985, 34, (1), 431–434.
  • T. MASUZAWA and K. K. TONSHOFF: Ann. mt. Inst. Prod. Eng. Res. (CIRP), 1997, 46, (2), 620— 628.
  • M. SATO: ‘Handbook of charged particles optics’, (ed. J. Orloff), 429-488; 1997, New York, CRC Press.
  • M. UTLAUT: ‘Handbook of Charged Particles Optics’, (ed. J. Orloff), 429 —488; 1997, New York, CRC Press.
  • D. J. WHITEHOUSE: ‘Handbook of Surface Metrology’, 5–90; 1994, Philadelphia, IoP Publishing.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.