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Articles

Some aspects of a sputtered interfacial eta-carbide layer and its effect on a TiC-coated WC-Co cemented carbide

Pages 489-493 | Published online: 19 Jul 2013

References

  • M. LEE and m. H. RICHMAN: Metals Technol., 1974, 1, 538.
  • P. ETTMAYER and R. SUCHENTRUNK: Mortatsch. Chem., 1970, 101, 1098.
  • I. T. NORTON and R. K. LEWIS: NASA-CR-32I, 1963, Washing-ton, D.C., National Aeronautics and Space Administration.
  • B. D. CULLITY: 'Elements of X-ray diffraction'; 1956, Reading, Mass., Addison-Wesley.
  • W. D. SPROUL and M. H. RICHMAN: J. Vac. Sci. Technol., 1975, 12, 842.
  • H. E. HINTERMAN et al.: 'Proceedings Third International Con-ference on CVD', (ed. F. A. Glashi), 352; 1972, American Nuclear Society.
  • M. LEE: Ph.D thesis, Brown University, 1971.
  • W. D. SPROUL: Ph.D thesis, Brown University, 1975.
  • W. D. SPROUL and M. H. RICHMAN: Thin Solid Films, 1975, 28, (2), L39.
  • D. E. MAYER: J. Vac. Sci. Technol.,1974 11,168.
  • M. LEE and M. H. RICHMAN: J. Electrochem. Sac: Solid State Sci. Technol.,1973,120,993.
  • JCPDS Powder Diffraction File Card Number 23–939, 1975, Joint Committee on Powder Diffraction Standards, Swarthmore, Pennsylvania. B. ibid., Card Number 6–0614.

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