References
- Moszczyński, J. Dactyloscopy—Theory and Practice, 1997 (Central Forensic Laboratory of Police Publishing, Warszawa).
- Vickerman, J. C. and Briggs, D. (eds.) TOF-SIMS: Surface Analysis by Mass Spectrometry, 2001 (IM Publications and Surface Spectra, Huddersfield).
- Benninghoven, A. Chemical analysis of inorganic and organic surfaces and thin films by static time-of-flight secondary ion mass spectrometry (TOF-SIMS). Angew. Chem. Int. Ed. Engl., 1994, 33, 1023–1043.
- Paryjczak, T. and Szynkowska, M. I. The use of time- of-flight secondary ion mass spectrometry (TOF-SIMS) for solid surface studies. Przem. Chem., 2003, 82/3, 199–206.
- Takatsuji, H. Advanced time-of-flight secondary ion mass spectrometry analyses for application to TFT-LCD. Mater. Sci. Semicond. Process., 2001, 4, 309–312.
- Saldi, F., Schneider, S., Marson, C., Wenning, R. and Migeon, H. N. In Secondary Ion Mass Spectrometry, SIMS XI (eds. A. Benninghoven, P. Bertrand, H. N. Migeon and H. W. Werner), 2000, p. 893 (Elsevier, Amsterdam).
- Kempson, I. M., Skinner, W. M. and Kirkbride, P. K. Calcium distributions in human hair by ToF-SIMS. Biochim. Biophys. Acta, 2003, 1624, 1–5.
- Audinot, J.–N., Yegles, M., Labarthe, A., Ruch, D., Wennig, R. and Migeon, H.-N. Detection and quantification of benzodiazepines in hair by ToF-SIMS: preliminary results. Appl. Surf. Sci., 2003, 203–204, 718–721.
- Yegles, M., Mersch, F. and Wennig, R. Detection of benzodiazepines and other psychotropis drugs in human hair by GC/MS. Forensic Sci. Int., 1997, 84, 211–218.
- Belu, A. M., Graham, D. J. and Castner, D. G. Time- of-flight secondary ion mass spectrometry: techniques and applications for the chracterization of biomaterial surfaces. Biomaterials, 2003, 24, 3635–3653.
- Roberson, S., Sehgal, A., Fahey, A. and Karim, A. Time-of-flight secondary ion mass spectrometry (TOF- SIMS) for high-throughput characterization of biosurfaces. Appl. Surf. Sci., 2003, 203–204, 855–858.
- Chen, C. Y., Ling, Y. C., Wang, J. T. and Chen, H. Y. SIMS depth profiling analysis of electrical arc residues in fire investigations. Appl. Surf. Sci., 2003, 203–204, 779–784.
- Coumbaros, J., Kirkbride, K. P., Klass, G. and Skinner, W. Characterisation of 0,22 calibre rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study. Forensic Sci. Int., 2001, 119, 72–81.
- Materials ION-TOF, Münster, www.ion-tof.com, accessed February 2005.