REFERENCES
- H. Rowley, S. Baluja and T. Kanade: Proc. IEEE Conf. on ‘Computer vision and pattern recognition’, San Francisco, CA, USA, June 1996, IEEE, 203–207.
- D. Valentin: Pattern Recogn., 1994, 27, (9), 1209–1230.
- B. Heisele, T. Poggio and M. Pontil: ‘Face detection in still gray images’, Technical report A. I. Memo No. 1687, MIT, Cambridge, MA, USA, 2000.
- E. Osuna, R. Freund and F. Girosi: Proc. IEEE. Conf. on ‘Computer vision and pattern recognition’, Puerto Rico, June 1997, IEEE.
- D. Chai and K. N. Ngan: IEEE Trans. Circuits Syst. Technol., 1999, 9, (4), 551–564.
- C. Kotropoulos and I. Pitas: Proc. Int. Conf. on ‘Acoustics, speech and signal processing’, Vol. 4, 21–24; 1997, Munich, IEEE.
- H. Wu, Q. Chen and M. Yachida: IEEE Trans. Pattern Anal. Mach. Intellig., 1999, 21, 557–563.
- G. Yang and T. S. Huang: Pattern Recogn., 1994, 27, (1), 53–63.
- K. I. J. Ho and T. S. Chen and C. Y. Cheng: Mach. Graph. Vision, 2002, 11, (2/3), 241–256.
- Q. Chen, H. Wu and M. Yachida: Proc. 5th Int. Conf. on ‘Computer Vision’, 591–596; 1995, Boston, MIT.
- R. Chellapa, C. L. Wilson and S. Sirohey: Proc. IEEE, 1995, 83, (5), 705–740.
- M. H. Yang, N. Ahuja and D. Kriegman: IEEE Trans. Pattern Anal. Mach. Intellig., 2002, 24, 34–58.
- E. Saber and A. M. Tekalp: Pattern Recogn. Lett., 1998, 19, 669–680.
- H. Lee: Proc. IEEE Int. Symp. On ‘Industrial electronics’, Pusan, Korea, June 2001, IEEE, 254–259.
- A. Al-Qayedi and A. F. Clark: Proc. 7th Int. Conf. on ‘Image processing and its application’, Manchester, UK, July 1999, IEEE, 625–629.
- S. M. Smith and J. M. Brady: Int. J. Comput. Vision, 1997, 23, (1), 45–78.
- K. C. Yow and R. Cipolla: Image Vision Comput., 1997, 15, 713–735.