REFERENCES
- T. A. Badawi: Proc. Int. Conf. on ‘Rice’, Rome, Italy, February 2004, FAO, pp. 102–114.
- 2 Food and Agricultural Organization of the United Nations: ‘FAO agricultural database’, 2004, available at: http://www.fao.org.
- S. C. Scardaci, R. K. Webster, C. A. Greer, J. E. Hill, J. F. Williams, R. G. Mutters, D. M. Brandon, K. S. McKenzie and J. J. Oster: in ‘Agronomy fact sheet series 1997–2’; 1997, Davis, CA, University of California, Davis.
- J. Williams and S. G. Smith: Better Crops, 2001, 85, (1), 7–9.
- D. Dunn and G. Stevens: Better Crops, 2005, 89, (1), 15–17.
- G. C. Gerloff and W. H. Gabelman: Plant Soil, 1983, 72, (2–3), 335–350, 335–360.
- S. Peng, F. V. Garcia, R. C. Laza, A. L. Sanico, R. M. Visperas and K. G. Cassman: Field Crops Res., 1996, 4, 243–252.
- C. Wit, J. M. Pasuquin, R. Mutters and R. J. Buresh: Better Crops, 2005, 89, (1), 36–39.
- Site-Specific Nutrient Management (SSNM), available at: http://www.irri.org/irrc/ssnm/lcc/handoutLCC.asp.
- H. K. Manandhar, H. J. Lyngs Jorgensen, S. B. Mathur and V. Smedegaard-Petersen: Phytopathology, 1998, 88, (7), 735–739.
- N. A Amusa: Afr. J. Biotechnol., 2006, 5, (5), 405–414.
- U. Dhua: Curr. Sci., 1986, 55, (8), 410–488.
- P. S. Teng, H. W. Klein-Gebbnick and H. Pinnschimdt: in ‘Rice blast modeling and forecasting’, 1–30; 1991, Manila, IRRI.
- L. Bastiaans: ‘Understanding yield reduction in rice due to leaf blast’, PhD thesis, Wageningen Agricultural University, The Netherlands, 1993.
- M. Biloni, M. Rodolfi, D. Rodino and A. M. Picco: Proc. 1st Asia-Europe Workshop on ‘Sustainable resource management and policy options for rice ecosystems’, SUMAPOL2005, Hangzhou, China, May 2005, Article 2.
- U. Bhattacharya, B. B. Chaudhuri and S. K. Parui: Image Vis. Comput., 1997, 15, 937–948.
- Rice Doctor: International Rice Research Institute, available at: http://www.knowledgebank.irri.org/ ricedoctor.
- Rice Doctor: International Rice Research Institute, Philippines, 2003, available at: www.irri.org.
- A. K. Jain and F. Farrokhnia: Pattern Recognit., 1991, 24, 1167–1186.
- T. Randen and J. H. Husoy: IEEE Trans. Image Process., 1999, 8, 571–582.
- M. M. Chang, M. I. Sezan and A. M. Tekalp: J. Electron. Imaging, 1994, 3, (4), 404–414.
- D. Comaniciu and P. Meer: Proc. IEEE Conf. on ‘Computer vision and pattern recognition’, San Juan, PR, USA, June 1997, IEEE, 750–755.
- Y. Deng and B. S. Manjunath: IEEE Trans. Pattern Anal. Machine Intell., 2001, 23, (8), 800–810.
- Z. Kato, T. C. Pong and G. Q. Song: Proc. Int. Conf. on ‘Image processing’, Barcelona, Spain, September 2003, IEEE, Vol. 1, 961–964.
- T. Ojala and M. Pietikainen: Pattern Recognit., 1999, 32, (3), 477–486.
- K. B. Eom: Image Vis. Comput., 1999, 17, (3–4), 233–244.
- A. Drimbarean and P. F. Whelan: Pattern Recognit. Lett., 2001, 22, 1161–1167.
- P. F. Whelan and D. Molloy: ‘Machine vision algorithms in Java: techniques and implementation’; 2000, London, Springer.
- D. E. Rumelhart, G. E Hinton and R. J. Williams: ‘Learning internal representations by error propagation’, Institute for Cognitive Science Report 8506, University of California, San Diego, CA, USA, 1985.
- U. Bhattacharya and S. K. Parui: Proc. Int. Conf. on ‘Neural networks’, Perth, Australia, November–December 1995, IEEE, 2784–2788.
- P. H. Lewis: ‘Digital cameras improve as their prices fall’, The New York Times, 18th November, 1999.
- Reuters: ‘Profits fading in digital camera industry’, 19th November, 2004, Available at: http://www.washingtonpost.com/wp-dyn/articles/A1571–2004Nov21_2.html.