Advanced search
Publication Cover
The Imaging Science Journal Volume 57, 2009 - Issue 6: High Speed Photography and Photonics
Submit an article Journal homepage
38
Views
8
CrossRef citations to date
0
Altmetric
Articles

Novel measurements of material properties at high rates of strain using speckle metrology

C R SiviourSMF Group Cavendish Laboratory, Cambridge CB3 0HE, UK; Department of Engineering Science, Parks Road, OxfordOX1 3PJ, UK
,
S G GranthamSMF Group Cavendish Laboratory, CambridgeCB3 0HE, UK
,
D M WilliamsonSMF Group Cavendish Laboratory, CambridgeCB3 0HE, UK
,
W G ProudSMF Group Cavendish Laboratory, CambridgeCB3 0HE, UK
&
J E FieldSMF Group Cavendish Laboratory, CambridgeCB3 0HE, UK
Pages 326-332 | Published online: 29 Nov 2013

REFERENCES

  • Sjödahl, M. In Digital Speckle Pattern Interferometry and Related Techniques (Ed. P. K. Rastogi), 2001, pp. 337–362 (John Wiley & Sons, Chichester).
  • Gåsvik, K. J. Optical Metrology, 2002 (John Wiley & Sons, New York).
  • Siviour, C. and Grantham, S. High resolution optical measurements of specimen deformation in the split Hopkinson pressure bar. Imag. Sci. J., 2009, 57, 332–342.
  • Grantham, S. G., Siviour, C. R., Proud, W. G. and Field, J. E. High-strain rate Brazilian testing of an explosive simulant using speckle metrology. Meas. Sci. Technol., 2004, 15, 1867–1870.
  • Funk, D. J., Laabs, G. W., Peterson, P. D. and Asay, B. W. In Shock Compression of Condensed Matter – 1995 (Ed. S. C. Schmidt and W. C. Tao), 1996, pp. 145–148 (American Institute of Physics, New York).
  • Idar, D. J., Peterson, P. D., Scott, P. D. and Funk, D. J. In Shock Compression of Condensed Matter – 1997 (Ed. S. C. Schmidt, D. P. Dandekar and J. W. Forbes), 1997, pp. 587–590 (American Institute of Physics, New York).
  • Williamson, D., Palmer, S., Grantham, S., Proud, W. and Field, J. In Shock Compression of Condensed Matter – 2003 (Ed. M. D. Furnish, Y. M. Gupta and J. W. Forbes), 2004, pp. 816–819 (American Institute of Physics, New York).
  • Siviour, C. and Proud, W. In Shock Compression of Condensed Matter – 2007 (Ed. M. Elert, M. Furnish, R. Chau, N. Holmes and J. Nguyen), 2007, pp. 799–803 (American Institute of Physics, New York).
  • Gilat, A. In ASM Handbook, Vol. 8, Mechanical Testing and Evaluation (Ed. H. Kuhn and D. Medlin), 2000, pp. 505–515 (ASM International, Materials Park, OH).
  • Nemat-Nasser, S. In ASM Handbook, Vol. 8, Mechanical Testing and Evaluation (Ed. H. Kuhn and D. Medlin), 2000, pp. 477–487 (ASM International, Materials Park, OH).
  • Gray III, G. T. In ASM Handbook, Vol. 8, Mechanical Testing and Evaluation (Ed. H. Kuhn and D. Medlin), 2000, pp. 462–476 (ASM International, Materials Park, OH).
  • Walley, S. M. Hopkinson bar testing at non-ambient temperatures, Proc. 6th Int. Conf. on Mechanical and physical behaviour of materials under dynamic loading: DYMAT 2000, Krakow, Poland, September 2000, pp. 67–94 Institute of Fundamental Technological Research.
  • Armstrong, R. W. In Yield, Flow, and Fracture of Polycrystals (Ed. T. N. Baker), 1983, pp. 1–31 (Applied Science Publishers, Barking).
  • Gorham, D. A., Pope, P. H. and Field, J. E. An improved method for compressive stress-strain measurements at very high strain rates. Proc. R. Soc. Lond. A, 1992, 438A, 153–170.
  • Liu, C. On the minimum size of representative volume element: an experimental investigation. Exp. Mech., 2005, 45, 238.
  • Gorham, D. A. Specimen inertia in high strain-rate compression. J. Phys. D, Appl. Phys., 1989, 22D, 1888–1893.
  • Sjödahl, M. and Benckert, L. R. Electronic speckle photography: analysis of an algorithm giving the displacement with subpixel accuracy. Appl. Opt., 1993, 32, 2278–2284.
  • Sjödahl, M. Electronic speckle photography: increased accuracy by non-integral pixel shifting. Appl. Opt., 1994, 33, 6667–6673.
  • Sjödahl, M. and Benckert, L. R. Systematic and random errors in electronic speckle photography. Appl. Opt., 1994, 33, 7461–7471.
  • Sjödahl, M. Accuracy in electronic speckle photography. Appl. Opt., 1997, 36, 2875–2885.
  • Awaji, H. and Sato, S. Diametral compressive testing method. J. Eng. Mater. Technol., 1979, 101, 139–147.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.