References
- I.-L. Hwang and S.-J. Na: Metall. Mater. Trans. B, 2005, B36, 133–139.
- U. Dilthey, A. Brandenburg, M. Moller and G. Smolka: Weld. Cutt., 2005, 52, (7), E143–E148.
- B. M. Nowak-Neely, G. A. Knorovsky and D. O. MacCallum: Proc. AWS Weld. Show, Chicago, IL, USA, April 2004, AWS pp 85.
- J. I. Goldstein, D. E. Newbury, D. C. Joy, C. E. Lyman, P. Echlin, E. Lifshin, L. Sawyer and J. R. Michael: ‘Scanning electron microscopy and X-ray microanalysis’, 61–98; 2003, New York, Klower Academic and Plenum Publishers.
- R. Gauvin, D. Drouin and A. R. Couture: Casino v2·42, available at: www.gel.usherb.ca/casino/
- K. F. J. Heinrich, D. E. Newbury and H. Yakowitz (eds.): ‘Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy’, 460; 1976, Washington, DC, National Bureau of Standards Special Publication.
- D. C. Joy: ‘Monte Carlo modeling for electron microscopy and microanalysis’, 82; 1995, New York, Oxford University Press.
- J. I. Goldstein, D. E. Newbury, D. C. Joy, C. E. Lyman, P. Echlin, E. Lifshin, L. Sawyer and J. R. Michael: ‘Scanning electron microscopy and X-ray microanalysis’, 61–98; 2003, New York, Springer.
- D. C. Joy: ‘Monte Carlo modeling for electron microscopy and microanalysis’, 81–115; 1995, New York, Oxford University Press.
- D. Drouin, R. Gauvin and D. C. Joy: Scanning, 1994, 16, 67–77.
- Z. Czyzewski, D. O. MacCallum, A. D. Romig and D. C. Joy: J. Appl. Phys., 1990, 68, 3066–3072
- D. C. Joy and S. Luo: Scannning, 1989, 11, 176.
- E. Casnati, A. Tartari and C. Baraldi: J. Phys. B, 1982, B15, 155–167.
- W.H. Press, B.P. Flannery, S. A. Teukolsky and W. T. Vetterling: ‘Numerical recipes’; 1986, New York, Cambridge University Press.
- G. Soum, F. Arnal, J. L. Balladore, B. Jouffrey and P. Verdier: Ultramicroscopy, 1979, 4, 451–466.