References
- Kuppusami P, Padhi SN, Muthukkumaran K, Mohandas E, Raghunathan VS: Surf. Eng., 2005, 21, 172–175.
- Bellin M, Van AJ, Molen D: Eur. J. Radiol., 2008, 66, 160–165.
- Forsting M, Palkowitsch P: Eur. J. Radiol., 2010, 74, 186–189.
- Leckie RM, Kramer S, Ruhle M, Levi CG: Acta Mater., 2005, 53, 3281–3284.
- Pampillón MA, Feijoo PC, San EA, Lucía ML, Prado AD, Luque MT: Microelectron. Eng., 2011, 88, 2991–2996.
- Mann JR, Bhattacharya RN: Thin Solid Films, 2010, 519, 210–213.
- Zhang HS, Liao SR, Dang XD, Guan SK, Zhang Z: J. Alloys Compd, 2011, 509, 1226–1229.
- Sanchette F, Ducros C, Billard A, Rébéré C, Berziou C, Reffass M, Creus J: Thin Solid Films, 2009, 518, 1575–1579.
- Renk TJ, Sridharan K, Harrington SP, Johnson AK, Lahoda E: Nucl. Instrum: Methods Phys. Res. Sect. B, 2010, 268B, 2666–2669.
- Cavaliere P: Mater. Sci. Eng. A, 2009, A512, 1–5.
- Fu DX, Xu BS, Zhang W, Wei SC, Liu Y: Surf. Eng., 2009, 25, 612–614.
- Liu ZG, Ouyang JH, Zhou Y, Li S: J. Eur. Ceram. Soc., 2010, 30, 2707–2710.
- Zhitomirsky I, Petric A: Mater. Lett., 2000, 42, 273–275.
- Suresh S, Giannakopoulos AE: Acta Mater., 1998, 46, 5755–5767.