References
- Yao X, Song Y, Jiang L: Adv. Mater., 2011, 23, 719–734.
- Fang M, Tang Z, Lu H, Nutt S: J. Mater. Chem., 2012, 22, 109–114.
- Cao L, Jones AK, Sikka VK, Wu J, Gao D: Langmuir, 2009, 25, 12444–12448.
- Huang Y, Hu M, Yi S, Liu X, Li H, Huang C, Luo Y, Li Y: Thin Solid Films, 2012, 520, 5644–5651.
- Zhang H, Lamb RN: Surf. Eng., 2009, 25, 21–24.
- Li X, Shen J: Chem. Commun., 2011, 47, 10761–10763.
- Saleema N, Sarkar DK, Gallant D, Paynter RW, Chen XG: ACS Appl. Mater. Interfaces, 2011, 3, 4775–4781.
- Bhushan B: Langmuir, 2012, 28, 1698–1714.
- Yao X, Chen Q, Xu L, Li Q, Song Y, Gao X, Quere D, Jiang L: Adv. Funct. Mater., 2010, 20, 656–662.
- Wang SD, Tzai XY: Surf. Eng., 2011, 27, 272–278.
- Wang Z, Li Q, She Z, Chen F, Li L: J. Mater. Chem., 2012, 22, 4097–4105.
- Fresnais J, Benyahia L, Poncin-Epaillard F: Surf. Interface Anal., 2006, 38, 144–149.
- Ye X, Ding Y, Liu H, Duan Y: Thin Solid Films, 2010, 518, 6933–6937.
- Piech M, Sounart TL, Liu J: J. Phys. Chem. C, 2008, 112C, 20398–20405.
- Li Y, Li L, Sun J: Angew. Chem. Int. Ed., 2010, 49, 6129–6133.
- Wei ZJ, Liu WL, Tian D, Xiao CL, Wang XQ: Appl. Surf. Sci., 2010, 256, 3972–3976.
- Shang HM, Wang Y, Limmer SJ, Chou TP, Takahashi K, Cao GZ: Thin Solid Films, 2005, 472, 37–43.
- Dhere SL, Latthe SS, Kappenstein C, Pajonk GM, Ganesan V, Rao AV, Wagh PB, Gupta SC: Appl. Surf. Sci., 2010, 256, 3624–3629.
- Karapanagiotis I, Manoudis PN, Savva A, Panayiotou C: Surf. Interface Anal., 2012, 44, 870–875.
- Deng X, Mammen L, Zhao Y, Lellig P, Muellen K, Li C, Butt H.-J, Vollmer D: Adv. Mater., 2011, 23, 2962–2965.
- Wang X, Weiss RA: Langmuir, 2012, 28, 3298–3305.
- Jin M, Feng X, Xi J, Zhai J, Cho K, Feng L, Jiang L: Macromol. Rapid Commun., 2005, 26, 1805–1809.
- Fan ZP, Liu WL, Wei ZJ, Yao JS, Sun XL, Li M, Wang XQ: Appl. Surf. Sci., 2011, 257, 4296–4301.
- Hsieh C.-T, Wu F.-L, Yang S.-Y: Surf. Coat. Technol., 2008, 202, 6103–6108.
- Han KD, Leo CP, Chai SP: Appl. Surf. Sci., 2012, 258, 6739–6744.
- Pham DC, Na K, Piao S, Yang S, Kim J, Yoon ES: Surf. Eng., 2011, 27, 286–293.